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@article{DBLP:journals/et/Agrawal16, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {1--2}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5569-1}, doi = {10.1007/S10836-016-5569-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal16a, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {107--108}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5580-6}, doi = {10.1007/S10836-016-5580-6}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal16a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal16b, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {241--242}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5596-y}, doi = {10.1007/S10836-016-5596-Y}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal16b.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal16c, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {399}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5609-x}, doi = {10.1007/S10836-016-5609-X}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal16c.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal16d, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {505--506}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5618-9}, doi = {10.1007/S10836-016-5618-9}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal16d.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal16e, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {653--654}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5629-6}, doi = {10.1007/S10836-016-5629-6}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal16e.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/AleksejevDJS16, author = {Igor Aleksejev and Sergei Devadze and Artur Jutman and Konstantin Shibin}, title = {Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {245--255}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5588-y}, doi = {10.1007/S10836-016-5588-Y}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/AleksejevDJS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/AzaisDLL16, author = {Florence Aza{\"{\i}}s and Stephane David{-}Grignot and Laurent Latorre and Francois Lefevre}, title = {{SSB} Phase Noise Evaluation of Analog/IF Signals on Standard Digital {ATE}}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {69--82}, year = {2016}, url = {https://doi.org/10.1007/s10836-015-5556-y}, doi = {10.1007/S10836-015-5556-Y}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/AzaisDLL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/BashirSEB16, author = {Imran Bashir and Robert Bogdan Staszewski and Oren E. Eliezer and Poras T. Balsara}, title = {A Wideband Digital-to-Frequency Converter with Built-In Mechanism for Self-Interference Mitigation}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {437--445}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5607-z}, doi = {10.1007/S10836-016-5607-Z}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/BashirSEB16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/BistouniJ16, author = {Fathollah Bistouni and Mohsen Jahanshahi}, title = {Reliability Analysis of Fault-Tolerant Bus-Based Interconnection Networks}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {541--568}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5601-5}, doi = {10.1007/S10836-016-5601-5}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/BistouniJ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/CanKF16, author = {Yavuz Can and Hassen Kassim and Georg Fischer}, title = {New Boolean Equation for Orthogonalizing of Disjunctive Normal Form based on the Method of Orthogonalizing Difference-Building}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {197--208}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5572-6}, doi = {10.1007/S10836-016-5572-6}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/CanKF16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ChenCWWLZC16, author = {Qingyu Chen and Li Chen and Haibin Wang and Longsheng Wu and Yuanqing Li and Xing Zhao and Mo Chen}, title = {Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {695--703}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5624-y}, doi = {10.1007/S10836-016-5624-Y}, timestamp = {Wed, 26 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ChenCWWLZC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ChenWCLZLCL16, author = {Qingyu Chen and Haibin Wang and Li Chen and Lixiang Li and Xing Zhao and Rui Liu and Mo Chen and Xuantian Li}, title = {An SEU-Resilient {SRAM} Bitcell in 65-nm {CMOS} Technology}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {385--391}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5586-0}, doi = {10.1007/S10836-016-5586-0}, timestamp = {Wed, 26 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ChenWCLZLCL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/CopettiMPV16, author = {Thiago Copetti and Guilherme Cardoso Medeiros and Leticia Bolzani Poehls and Fabian Vargas}, title = {NBTI-Aware Design of Integrated Circuits: {A} Hardware-Based Approach for Increasing Circuits' Life Time}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {315--328}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5592-2}, doi = {10.1007/S10836-016-5592-2}, timestamp = {Fri, 03 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/CopettiMPV16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Coulie-Castellani16, author = {Karine Couli{\'{e}}{-}Castellani and Wenceslas Rahajandraibe and Gilles Micolau and Hassen Aziza and Jean{-}Michel Portal}, title = {Optimization of a Particles Detection Chain Based on a {VCO} Structure}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {21--30}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5563-7}, doi = {10.1007/S10836-016-5563-7}, timestamp = {Sat, 09 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Coulie-Castellani16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/CuiSW16, author = {Yiqian Cui and Junyou Shi and Zili Wang}, title = {Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {661--679}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5620-2}, doi = {10.1007/S10836-016-5620-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/CuiSW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/DofePY16, author = {Jaya Dofe and Hoda Pahlevanzadeh and Qiaoyan Yu}, title = {A Comprehensive FPGA-Based Assessment on Fault-Resistant {AES} against Correlation Power Analysis Attack}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {611--624}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5598-9}, doi = {10.1007/S10836-016-5598-9}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/DofePY16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/FerrarettoP16, author = {Davide Ferraretto and Graziano Pravadelli}, title = {Simulation-based Fault Injection with {QEMU} for Speeding-up Dependability Analysis of Embedded Software}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {43--57}, year = {2016}, url = {https://doi.org/10.1007/s10836-015-5555-z}, doi = {10.1007/S10836-015-5555-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/FerrarettoP16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/GorenGY16, author = {Sezer G{\"{o}}ren and Cemil Cem G{\"{u}}rsoy and Abdullah Yildiz}, title = {Erratum to: Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {105--106}, year = {2016}, url = {https://doi.org/10.1007/s10836-015-5558-9}, doi = {10.1007/S10836-015-5558-9}, timestamp = {Tue, 16 Nov 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/GorenGY16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HanafySW16, author = {Mohamed Hanafy and Hazem Said and Ayman M. Wahba}, title = {New Methodology for Complete Properties Extraction from Simulation Traces Guided with Static Analysis}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {705--719}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5626-9}, doi = {10.1007/S10836-016-5626-9}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HanafySW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HouLLCYW16, author = {Bing Hou and Tong Liu and Jun Liu and Junli Chen and Fa{-}Xin Yu and Wenbo Wang}, title = {A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {649--652}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5613-1}, doi = {10.1007/S10836-016-5613-1}, timestamp = {Sat, 22 Apr 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HouLLCYW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HuLXJ16, author = {Cong Hu and Zhi Li and Chuan{-}pei Xu and Mengyi Jia}, title = {Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {31--42}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5565-5}, doi = {10.1007/S10836-016-5565-5}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HuLXJ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HuXZLG16, author = {Zewen Hu and Mingqing Xiao and Lei Zhang and Shuai Liu and Yawei Ge}, title = {Mahalanobis Distance Based Approach for Anomaly Detection of Analog Filters Using Frequency Features and Parzen Window Density Estimation}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {681--693}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5623-z}, doi = {10.1007/S10836-016-5623-Z}, timestamp = {Wed, 24 Mar 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/HuXZLG16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/IshidaNKKA16, author = {Masahiro Ishida and Toru Nakura and Takashi Kusaka and Satoshi Komatsu and Kunihiro Asada}, title = {Dynamic Power Integrity Control of {ATE} for Eliminating Overkills and Underkills in Device Testing}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {257--271}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5582-4}, doi = {10.1007/S10836-016-5582-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/IshidaNKKA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/JenihhinSCTKGVR16, author = {Maksim Jenihhin and Giovanni Squillero and Thiago Santos Copetti and Valentin Tihhomirov and Sergei Kostin and Marco Gaudesi and Fabian Vargas and Jaan Raik and Matteo Sonza Reorda and Leticia Bolzani Poehls and Raimund Ubar and Guilherme Cardoso Medeiros}, title = {Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {273--289}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5589-x}, doi = {10.1007/S10836-016-5589-X}, timestamp = {Fri, 03 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/JenihhinSCTKGVR16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/JothinV16, author = {R. Jothin and C. Vasanthanayaki}, title = {High Performance Significance Approximation Error Tolerance Adder for Image Processing Applications}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {377--383}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5587-z}, doi = {10.1007/S10836-016-5587-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/JothinV16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/JunejaPISNAVG16, author = {Kapil Juneja and Darayus Adil Patel and Rajesh Kumar Immadi and Balwant Singh and Sylvie Naudet and Pankaj Agarwal and Arnaud Virazel and Patrick Girard}, title = {An Effective Power-Aware At-Speed Test Methodology for {IP} Qualification and Characterization}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {721--733}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5621-1}, doi = {10.1007/S10836-016-5621-1}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/JunejaPISNAVG16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/KumarAL16, author = {T. Nandha Kumar and Haider A. F. Almurib and Fabrizio Lombardi}, title = {Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based {LUT}}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {587--599}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5611-3}, doi = {10.1007/S10836-016-5611-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/KumarAL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LegerW16, author = {Gildas L{\'{e}}ger and Carsten Wegener}, title = {Guest Editorial: Analog, Mixed-Signal and {RF} Testing}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {405--406}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5608-y}, doi = {10.1007/S10836-016-5608-Y}, timestamp = {Sat, 09 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LegerW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LeisenbergerS16, author = {Friedrich Peter Leisenberger and Gregor Schatzberger}, title = {An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {447--458}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5605-1}, doi = {10.1007/S10836-016-5605-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LeisenbergerS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LiA16, author = {Baohu Li and Vishwani D. Agrawal}, title = {Applications of Mixed-Signal Technology in Digital Testing}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {209--225}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5576-2}, doi = {10.1007/S10836-016-5576-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LiA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LiBCR16, author = {Yan Li and Steven Bielby and Azhar A. Chowdhury and Gordon W. Roberts}, title = {A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data {I/O}}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {423--436}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5604-2}, doi = {10.1007/S10836-016-5604-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LiBCR16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LiLM0LWWNC16, author = {Yuanqing Li and Lixiang Li and Yuan Ma and Li Chen and Rui Liu and Haibin Wang and Qiong Wu and Michael Newton and Mo Chen}, title = {A 10-Transistor 65 nm {SRAM} Cell Tolerant to Single-Event Upsets}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {137--145}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5573-5}, doi = {10.1007/S10836-016-5573-5}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LiLM0LWWNC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LiWL0LC16, author = {Yuanqing Li and Haibin Wang and Lixiang Li and Li Chen and Rui Liu and Mo Chen}, title = {A Built-in Single Event Upsets Detector for Sequential Cells}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {11--20}, year = {2016}, url = {https://doi.org/10.1007/s10836-015-5560-2}, doi = {10.1007/S10836-015-5560-2}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LiWL0LC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LinCGZCF16, author = {Qian Lin and Qian{-}Fu Cheng and Junjie Gu and Yuanyuan Zhu and Chao Chen and Haipeng Fu}, title = {Design and Temperature Reliability Testing for {A} 0.6-2.14GHz Broadband Power Amplifier}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {235--240}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5571-7}, doi = {10.1007/S10836-016-5571-7}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LinCGZCF16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LinFHC16, author = {Qian Lin and Haipeng Fu and Feifei He and Qian{-}Fu Cheng}, title = {Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {481--489}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5606-0}, doi = {10.1007/S10836-016-5606-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LinFHC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LiuHL16, author = {Jun Liu and Yu Ping Huang and Kai Lu}, title = {Four-Port Network Parameters Extraction Method for Partially Depleted {SOI} with Body-Contact Structure}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {763--767}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5625-x}, doi = {10.1007/S10836-016-5625-X}, timestamp = {Sat, 22 Apr 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LiuHL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LodhiHHA16, author = {Faiq Khalid Lodhi and Syed Rafay Hasan and Osman Hasan and Falah R. Awwad}, title = {Analyzing Vulnerability of Asynchronous Pipeline to Soft Errors: Leveraging Formal Verification}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {569--586}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5619-8}, doi = {10.1007/S10836-016-5619-8}, timestamp = {Fri, 09 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LodhiHHA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LuoWHC16, author = {Kun{-}Lun Luo and Ming{-}Hsueh Wu and Chun{-}Lung Hsu and Chen{-}An Chen}, title = {Built-In Self-Test Design for the 3D-Stacked Wide-I/O {DRAM}}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {111--123}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5570-8}, doi = {10.1007/S10836-016-5570-8}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LuoWHC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/MeloT16, author = {Jo{\~{a}}o Guilherme Mour{\~{a}}o Melo and Frank Sill Torres}, title = {Exploration of Noise Impact on Integrated Bulk Current Sensors}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {163--173}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5579-z}, doi = {10.1007/S10836-016-5579-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/MeloT16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/NagamaniAAA16, author = {A. N. Nagamani and S. Ashwin and B. Abhishek and Vinod Kumar Agrawal}, title = {An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {175--196}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5574-4}, doi = {10.1007/S10836-016-5574-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/NagamaniAAA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/NasrA16, author = {Abdurrahman A. Nasr and Mohamed Z. Abdulmageed}, title = {Automatic Feature Selection of Hardware Layout: {A} Step toward Robust Hardware Trojan Detection}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {357--367}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5581-5}, doi = {10.1007/S10836-016-5581-5}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/NasrA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/NguyenODTM16, author = {Hieu Nguyen and Cagatay Ozmen and Aydin Dirican and Nurettin Tan and Martin Margala}, title = {A {CMOS} Ripple Detector for Voltage Regulator Testing}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {227--233}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5566-4}, doi = {10.1007/S10836-016-5566-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/NguyenODTM16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/OliveiraS16, author = {Cristina C. Oliveira and Jos{\'{e}} Machado da Silva}, title = {Fault Diagnosis in Highly Dependable Medical Wearable Systems}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {467--479}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5602-4}, doi = {10.1007/S10836-016-5602-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/OliveiraS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/PoulosV16, author = {Zissis Poulos and Andreas G. Veneris}, title = {Exemplar-based Failure Triage for Regression Design Debugging}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {125--136}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5577-1}, doi = {10.1007/S10836-016-5577-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/PoulosV16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/RajiG16, author = {Mohsen Raji and Behnam Ghavami}, title = {A Fast Statistical Soft Error Rate Estimation Method for Nano-scale Combinational Circuits}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {291--305}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5583-3}, doi = {10.1007/S10836-016-5583-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/RajiG16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/RenaudBLSMLN16, author = {Guillaume Renaud and Manuel J. Barrag{\'{a}}n and Asma Laraba and Haralampos{-}G. D. Stratigopoulos and Salvador Mir and Herv{\'{e}} Le Gall and Herv{\'{e}} Naudet}, title = {A 65nm {CMOS} Ramp Generator Design and its Application Towards a {BIST} Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {407--421}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5599-8}, doi = {10.1007/S10836-016-5599-8}, timestamp = {Wed, 28 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/RenaudBLSMLN16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/RoyGR16, author = {Surajit Kumar Roy and Chandan Giri and Hafizur Rahaman}, title = {Optimization of Test Wrapper for {TSV} Based 3D SOCs}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {511--529}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5610-4}, doi = {10.1007/S10836-016-5610-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/RoyGR16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/RuanHWZ16, author = {Aiwu Ruan and Haiyang Huang and Jingwu Wang and Yifan Zhao}, title = {A Routability-Aware Algorithm for Both Global and Local Interconnect Resource Test and Diagnosis of Xilinx SRAM-FPGAs}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {749--762}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5622-0}, doi = {10.1007/S10836-016-5622-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/RuanHWZ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/SaeediHK16, author = {Ehsan Saeedi and Md. Selim Hossain and Yinan Kong}, title = {Side-Channel Information Characterisation Based on Cascade-Forward Back-Propagation Neural Network}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {345--356}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5590-4}, doi = {10.1007/S10836-016-5590-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/SaeediHK16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ShintaniUHMS16, author = {Michihiro Shintani and Takumi Uezono and Kazumi Hatayama and Kazuya Masu and Takashi Sato}, title = {Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {601--609}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5614-0}, doi = {10.1007/S10836-016-5614-0}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/ShintaniUHMS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Streitwieser16, author = {Christian Streitwieser}, title = {Real-Time Adaptive Test Algorithm Including Test Escape Estimation Method}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {369--375}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5585-1}, doi = {10.1007/S10836-016-5585-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Streitwieser16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/TangX16, author = {Xiaofeng Tang and Aiqiang Xu}, title = {Practical Analog Circuit Diagnosis Based on Fault Features with Minimum Ambiguities}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {83--95}, year = {2016}, url = {https://doi.org/10.1007/s10836-015-5561-1}, doi = {10.1007/S10836-015-5561-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/TangX16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/UygurS16, author = {G{\"{u}}rkan Uygur and Sebastian Sattler}, title = {A New Approach for Modeling Inconsistencies in Digital-Assisted Analog Design}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {491--503}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5600-6}, doi = {10.1007/S10836-016-5600-6}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/UygurS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/VillacortaSC16, author = {Hector Villacorta and Jaume Segura and V{\'{\i}}ctor H. Champac}, title = {Impact of Fin-Height on {SRAM} Soft Error Sensitivity and Cell Stability}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {307--314}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5591-3}, doi = {10.1007/S10836-016-5591-3}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/VillacortaSC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/VohraS16, author = {Harpreet Vohra and Amardeep Singh}, title = {Optimal Selective Count Compatible Runlength Encoding for {SOC} Test Data Compression}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {735--747}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5617-x}, doi = {10.1007/S10836-016-5617-X}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/VohraS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/WaliVBGPR16, author = {Imran Wali and Arnaud Virazel and Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Matteo Sonza Reorda}, title = {A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing Cores}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {147--161}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5578-0}, doi = {10.1007/S10836-016-5578-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/WaliVBGPR16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/WangLDS0G16, author = {Haibin Wang and Mulong Li and Xixi Dai and Shuting Shi and Li Chen and Gang Guo}, title = {Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {97--103}, year = {2016}, url = {https://doi.org/10.1007/s10836-015-5559-8}, doi = {10.1007/S10836-015-5559-8}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/WangLDS0G16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16, title = {New Editors - 2016}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {3--5}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5568-2}, doi = {10.1007/S10836-016-5568-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16a, title = {2015 {JETTA} Reviewers}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {7--8}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5567-3}, doi = {10.1007/S10836-016-5567-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16b, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {9--10}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5564-6}, doi = {10.1007/S10836-016-5564-6}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16b.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16c, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {32}, number = {2}, pages = {109--110}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5575-3}, doi = {10.1007/S10836-016-5575-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16c.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16d, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {243--244}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5594-0}, doi = {10.1007/S10836-016-5594-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16d.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16e, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {401--403}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5603-3}, doi = {10.1007/S10836-016-5603-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16e.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16f, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {507--509}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5612-2}, doi = {10.1007/S10836-016-5612-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16f.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16g, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {655--657}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5628-7}, doi = {10.1007/S10836-016-5628-7}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16g.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X16h, title = {2015 {JETTA-TTTC} Best Paper Award}, journal = {J. Electron. Test.}, volume = {32}, number = {6}, pages = {659--660}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5627-8}, doi = {10.1007/S10836-016-5627-8}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X16h.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/YehHW16, author = {Kuen{-}Wei Yeh and Jiun{-}Lang Huang and Laung{-}Terng Wang}, title = {{CPP-ATPG:} {A} Circular Pipeline Processing Based Deterministic Parallel Test Pattern Generator}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {625--638}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5615-z}, doi = {10.1007/S10836-016-5615-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/YehHW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/YuSW16, author = {Wenxin Yu and Yongbo Sui and Junnian Wang}, title = {The Faults Diagnostic Analysis for Analog Circuit Based on {FA-TM-ELM}}, journal = {J. Electron. Test.}, volume = {32}, number = {4}, pages = {459--465}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5597-x}, doi = {10.1007/S10836-016-5597-X}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/YuSW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/YuanGSJ16, author = {Haiying Yuan and Kun Guo and Xun Sun and Zijian Ju}, title = {A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding}, journal = {J. Electron. Test.}, volume = {32}, number = {1}, pages = {59--68}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5562-8}, doi = {10.1007/S10836-016-5562-8}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/YuanGSJ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/YuanJSGW16, author = {Haiying Yuan and Zijian Ju and Xun Sun and Kun Guo and Xiuyu Wang}, title = {Test Data Compression for System-on-chip using Flexible Runs-aware {PRL} Coding}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {639--647}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5595-z}, doi = {10.1007/S10836-016-5595-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/YuanJSGW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ZamanzadehJ16, author = {Sharareh Zamanzadeh and Ali Jahanian}, title = {Security Path: An Emerging Design Methodology to Protect the {FPGA} IPs Against Passive/Active Design Tampering}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {329--343}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5593-1}, doi = {10.1007/S10836-016-5593-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ZamanzadehJ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ZhangHYHXL16, author = {Chaolong Zhang and Yigang He and Lifen Yuan and Wei He and Sheng Xiang and Zhigang Li}, title = {A Novel Approach for Diagnosis of Analog Circuit Fault by Using {GMKL-SVM} and {PSO}}, journal = {J. Electron. Test.}, volume = {32}, number = {5}, pages = {531--540}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5616-y}, doi = {10.1007/S10836-016-5616-Y}, timestamp = {Mon, 10 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ZhangHYHXL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ZhuMXSWHY16, author = {Dongdi Zhu and Jiongjiong Mo and Shiyi Xu and Yong{-}Heng Shang and Zhiyu Wang and Zheng{-}Liang Huang and Fa{-}Xin Yu}, title = {A New Capacitance-to-Frequency Converter for On-Chip Capacitance Measurement and Calibration in {CMOS} Technology}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {393--397}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5584-2}, doi = {10.1007/S10836-016-5584-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ZhuMXSWHY16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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