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@article{DBLP:journals/et/Agrawal16,
  author       = {Vishwani D. Agrawal},
  title        = {Editorial},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {1--2},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5569-1},
  doi          = {10.1007/S10836-016-5569-1},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Agrawal16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal16a,
  author       = {Vishwani D. Agrawal},
  title        = {Editorial},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {107--108},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5580-6},
  doi          = {10.1007/S10836-016-5580-6},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Agrawal16a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal16b,
  author       = {Vishwani D. Agrawal},
  title        = {Editorial},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {241--242},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5596-y},
  doi          = {10.1007/S10836-016-5596-Y},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Agrawal16b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal16c,
  author       = {Vishwani D. Agrawal},
  title        = {Editorial},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {399},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5609-x},
  doi          = {10.1007/S10836-016-5609-X},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Agrawal16c.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal16d,
  author       = {Vishwani D. Agrawal},
  title        = {Editorial},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {505--506},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5618-9},
  doi          = {10.1007/S10836-016-5618-9},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Agrawal16d.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal16e,
  author       = {Vishwani D. Agrawal},
  title        = {Editorial},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {653--654},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5629-6},
  doi          = {10.1007/S10836-016-5629-6},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Agrawal16e.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AleksejevDJS16,
  author       = {Igor Aleksejev and
                  Sergei Devadze and
                  Artur Jutman and
                  Konstantin Shibin},
  title        = {Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan
                  Architectures},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {245--255},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5588-y},
  doi          = {10.1007/S10836-016-5588-Y},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/AleksejevDJS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AzaisDLL16,
  author       = {Florence Aza{\"{\i}}s and
                  Stephane David{-}Grignot and
                  Laurent Latorre and
                  Francois Lefevre},
  title        = {{SSB} Phase Noise Evaluation of Analog/IF Signals on Standard Digital
                  {ATE}},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {69--82},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-015-5556-y},
  doi          = {10.1007/S10836-015-5556-Y},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/AzaisDLL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BashirSEB16,
  author       = {Imran Bashir and
                  Robert Bogdan Staszewski and
                  Oren E. Eliezer and
                  Poras T. Balsara},
  title        = {A Wideband Digital-to-Frequency Converter with Built-In Mechanism
                  for Self-Interference Mitigation},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {437--445},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5607-z},
  doi          = {10.1007/S10836-016-5607-Z},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/BashirSEB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BistouniJ16,
  author       = {Fathollah Bistouni and
                  Mohsen Jahanshahi},
  title        = {Reliability Analysis of Fault-Tolerant Bus-Based Interconnection Networks},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {541--568},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5601-5},
  doi          = {10.1007/S10836-016-5601-5},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/BistouniJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CanKF16,
  author       = {Yavuz Can and
                  Hassen Kassim and
                  Georg Fischer},
  title        = {New Boolean Equation for Orthogonalizing of Disjunctive Normal Form
                  based on the Method of Orthogonalizing Difference-Building},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {197--208},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5572-6},
  doi          = {10.1007/S10836-016-5572-6},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CanKF16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChenCWWLZC16,
  author       = {Qingyu Chen and
                  Li Chen and
                  Haibin Wang and
                  Longsheng Wu and
                  Yuanqing Li and
                  Xing Zhao and
                  Mo Chen},
  title        = {Instruction-Vulnerability-Factor-Based Reliability Analysis Model
                  for Program Memory},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {695--703},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5624-y},
  doi          = {10.1007/S10836-016-5624-Y},
  timestamp    = {Wed, 26 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ChenCWWLZC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChenWCLZLCL16,
  author       = {Qingyu Chen and
                  Haibin Wang and
                  Li Chen and
                  Lixiang Li and
                  Xing Zhao and
                  Rui Liu and
                  Mo Chen and
                  Xuantian Li},
  title        = {An SEU-Resilient {SRAM} Bitcell in 65-nm {CMOS} Technology},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {385--391},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5586-0},
  doi          = {10.1007/S10836-016-5586-0},
  timestamp    = {Wed, 26 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ChenWCLZLCL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CopettiMPV16,
  author       = {Thiago Copetti and
                  Guilherme Cardoso Medeiros and
                  Leticia Bolzani Poehls and
                  Fabian Vargas},
  title        = {NBTI-Aware Design of Integrated Circuits: {A} Hardware-Based Approach
                  for Increasing Circuits' Life Time},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {315--328},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5592-2},
  doi          = {10.1007/S10836-016-5592-2},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CopettiMPV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Coulie-Castellani16,
  author       = {Karine Couli{\'{e}}{-}Castellani and
                  Wenceslas Rahajandraibe and
                  Gilles Micolau and
                  Hassen Aziza and
                  Jean{-}Michel Portal},
  title        = {Optimization of a Particles Detection Chain Based on a {VCO} Structure},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {21--30},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5563-7},
  doi          = {10.1007/S10836-016-5563-7},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Coulie-Castellani16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CuiSW16,
  author       = {Yiqian Cui and
                  Junyou Shi and
                  Zili Wang},
  title        = {Analog Circuit Test Point Selection Incorporating Discretization-Based
                  Fuzzification and Extended Fault Dictionary to Handle Component Tolerances},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {661--679},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5620-2},
  doi          = {10.1007/S10836-016-5620-2},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CuiSW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DofePY16,
  author       = {Jaya Dofe and
                  Hoda Pahlevanzadeh and
                  Qiaoyan Yu},
  title        = {A Comprehensive FPGA-Based Assessment on Fault-Resistant {AES} against
                  Correlation Power Analysis Attack},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {611--624},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5598-9},
  doi          = {10.1007/S10836-016-5598-9},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/DofePY16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FerrarettoP16,
  author       = {Davide Ferraretto and
                  Graziano Pravadelli},
  title        = {Simulation-based Fault Injection with {QEMU} for Speeding-up Dependability
                  Analysis of Embedded Software},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {43--57},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-015-5555-z},
  doi          = {10.1007/S10836-015-5555-Z},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/FerrarettoP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GorenGY16,
  author       = {Sezer G{\"{o}}ren and
                  Cemil Cem G{\"{u}}rsoy and
                  Abdullah Yildiz},
  title        = {Erratum to: Speeding Up Logic Locking via Fault Emulation and Dynamic
                  Multiple Fault Injection},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {105--106},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-015-5558-9},
  doi          = {10.1007/S10836-015-5558-9},
  timestamp    = {Tue, 16 Nov 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/GorenGY16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HanafySW16,
  author       = {Mohamed Hanafy and
                  Hazem Said and
                  Ayman M. Wahba},
  title        = {New Methodology for Complete Properties Extraction from Simulation
                  Traces Guided with Static Analysis},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {705--719},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5626-9},
  doi          = {10.1007/S10836-016-5626-9},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/HanafySW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HouLLCYW16,
  author       = {Bing Hou and
                  Tong Liu and
                  Jun Liu and
                  Junli Chen and
                  Fa{-}Xin Yu and
                  Wenbo Wang},
  title        = {A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {649--652},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5613-1},
  doi          = {10.1007/S10836-016-5613-1},
  timestamp    = {Sat, 22 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/HouLLCYW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HuLXJ16,
  author       = {Cong Hu and
                  Zhi Li and
                  Chuan{-}pei Xu and
                  Mengyi Jia},
  title        = {Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph
                  Partition and Multiple Test Clocks},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {31--42},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5565-5},
  doi          = {10.1007/S10836-016-5565-5},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/HuLXJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HuXZLG16,
  author       = {Zewen Hu and
                  Mingqing Xiao and
                  Lei Zhang and
                  Shuai Liu and
                  Yawei Ge},
  title        = {Mahalanobis Distance Based Approach for Anomaly Detection of Analog
                  Filters Using Frequency Features and Parzen Window Density Estimation},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {681--693},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5623-z},
  doi          = {10.1007/S10836-016-5623-Z},
  timestamp    = {Wed, 24 Mar 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/HuXZLG16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/IshidaNKKA16,
  author       = {Masahiro Ishida and
                  Toru Nakura and
                  Takashi Kusaka and
                  Satoshi Komatsu and
                  Kunihiro Asada},
  title        = {Dynamic Power Integrity Control of {ATE} for Eliminating Overkills
                  and Underkills in Device Testing},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {257--271},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5582-4},
  doi          = {10.1007/S10836-016-5582-4},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/IshidaNKKA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JenihhinSCTKGVR16,
  author       = {Maksim Jenihhin and
                  Giovanni Squillero and
                  Thiago Santos Copetti and
                  Valentin Tihhomirov and
                  Sergei Kostin and
                  Marco Gaudesi and
                  Fabian Vargas and
                  Jaan Raik and
                  Matteo Sonza Reorda and
                  Leticia Bolzani Poehls and
                  Raimund Ubar and
                  Guilherme Cardoso Medeiros},
  title        = {Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale
                  Circuits},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {273--289},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5589-x},
  doi          = {10.1007/S10836-016-5589-X},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/JenihhinSCTKGVR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JothinV16,
  author       = {R. Jothin and
                  C. Vasanthanayaki},
  title        = {High Performance Significance Approximation Error Tolerance Adder
                  for Image Processing Applications},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {377--383},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5587-z},
  doi          = {10.1007/S10836-016-5587-Z},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/JothinV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JunejaPISNAVG16,
  author       = {Kapil Juneja and
                  Darayus Adil Patel and
                  Rajesh Kumar Immadi and
                  Balwant Singh and
                  Sylvie Naudet and
                  Pankaj Agarwal and
                  Arnaud Virazel and
                  Patrick Girard},
  title        = {An Effective Power-Aware At-Speed Test Methodology for {IP} Qualification
                  and Characterization},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {721--733},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5621-1},
  doi          = {10.1007/S10836-016-5621-1},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/JunejaPISNAVG16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KumarAL16,
  author       = {T. Nandha Kumar and
                  Haider A. F. Almurib and
                  Fabrizio Lombardi},
  title        = {Current-Based Testing, Modeling and Monitoring for Operational Deterioration
                  of a Memristor-Based {LUT}},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {587--599},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5611-3},
  doi          = {10.1007/S10836-016-5611-3},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/KumarAL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LegerW16,
  author       = {Gildas L{\'{e}}ger and
                  Carsten Wegener},
  title        = {Guest Editorial: Analog, Mixed-Signal and {RF} Testing},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {405--406},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5608-y},
  doi          = {10.1007/S10836-016-5608-Y},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LegerW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LeisenbergerS16,
  author       = {Friedrich Peter Leisenberger and
                  Gregor Schatzberger},
  title        = {An Efficient Contact Screening Method and its Application to High-Reliability
                  Non-Volatile Memories},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {447--458},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5605-1},
  doi          = {10.1007/S10836-016-5605-1},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LeisenbergerS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiA16,
  author       = {Baohu Li and
                  Vishwani D. Agrawal},
  title        = {Applications of Mixed-Signal Technology in Digital Testing},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {209--225},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5576-2},
  doi          = {10.1007/S10836-016-5576-2},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LiA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiBCR16,
  author       = {Yan Li and
                  Steven Bielby and
                  Azhar A. Chowdhury and
                  Gordon W. Roberts},
  title        = {A Jitter Injection Signal Generation and Extraction System for Embedded
                  Test of High-Speed Data {I/O}},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {423--436},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5604-2},
  doi          = {10.1007/S10836-016-5604-2},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LiBCR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiLM0LWWNC16,
  author       = {Yuanqing Li and
                  Lixiang Li and
                  Yuan Ma and
                  Li Chen and
                  Rui Liu and
                  Haibin Wang and
                  Qiong Wu and
                  Michael Newton and
                  Mo Chen},
  title        = {A 10-Transistor 65 nm {SRAM} Cell Tolerant to Single-Event Upsets},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {137--145},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5573-5},
  doi          = {10.1007/S10836-016-5573-5},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LiLM0LWWNC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiWL0LC16,
  author       = {Yuanqing Li and
                  Haibin Wang and
                  Lixiang Li and
                  Li Chen and
                  Rui Liu and
                  Mo Chen},
  title        = {A Built-in Single Event Upsets Detector for Sequential Cells},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {11--20},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-015-5560-2},
  doi          = {10.1007/S10836-015-5560-2},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LiWL0LC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LinCGZCF16,
  author       = {Qian Lin and
                  Qian{-}Fu Cheng and
                  Junjie Gu and
                  Yuanyuan Zhu and
                  Chao Chen and
                  Haipeng Fu},
  title        = {Design and Temperature Reliability Testing for {A} 0.6-2.14GHz Broadband
                  Power Amplifier},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {235--240},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5571-7},
  doi          = {10.1007/S10836-016-5571-7},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LinCGZCF16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LinFHC16,
  author       = {Qian Lin and
                  Haipeng Fu and
                  Feifei He and
                  Qian{-}Fu Cheng},
  title        = {Interconnect Reliability Analysis for Power Amplifier Based on Artificial
                  Neural Networks},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {481--489},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5606-0},
  doi          = {10.1007/S10836-016-5606-0},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LinFHC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiuHL16,
  author       = {Jun Liu and
                  Yu Ping Huang and
                  Kai Lu},
  title        = {Four-Port Network Parameters Extraction Method for Partially Depleted
                  {SOI} with Body-Contact Structure},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {763--767},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5625-x},
  doi          = {10.1007/S10836-016-5625-X},
  timestamp    = {Sat, 22 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LiuHL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LodhiHHA16,
  author       = {Faiq Khalid Lodhi and
                  Syed Rafay Hasan and
                  Osman Hasan and
                  Falah R. Awwad},
  title        = {Analyzing Vulnerability of Asynchronous Pipeline to Soft Errors: Leveraging
                  Formal Verification},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {569--586},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5619-8},
  doi          = {10.1007/S10836-016-5619-8},
  timestamp    = {Fri, 09 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LodhiHHA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LuoWHC16,
  author       = {Kun{-}Lun Luo and
                  Ming{-}Hsueh Wu and
                  Chun{-}Lung Hsu and
                  Chen{-}An Chen},
  title        = {Built-In Self-Test Design for the 3D-Stacked Wide-I/O {DRAM}},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {111--123},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5570-8},
  doi          = {10.1007/S10836-016-5570-8},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LuoWHC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MeloT16,
  author       = {Jo{\~{a}}o Guilherme Mour{\~{a}}o Melo and
                  Frank Sill Torres},
  title        = {Exploration of Noise Impact on Integrated Bulk Current Sensors},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {163--173},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5579-z},
  doi          = {10.1007/S10836-016-5579-Z},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/MeloT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NagamaniAAA16,
  author       = {A. N. Nagamani and
                  S. Ashwin and
                  B. Abhishek and
                  Vinod Kumar Agrawal},
  title        = {An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres
                  based Reversible Circuits},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {175--196},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5574-4},
  doi          = {10.1007/S10836-016-5574-4},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/NagamaniAAA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NasrA16,
  author       = {Abdurrahman A. Nasr and
                  Mohamed Z. Abdulmageed},
  title        = {Automatic Feature Selection of Hardware Layout: {A} Step toward Robust
                  Hardware Trojan Detection},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {357--367},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5581-5},
  doi          = {10.1007/S10836-016-5581-5},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/NasrA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NguyenODTM16,
  author       = {Hieu Nguyen and
                  Cagatay Ozmen and
                  Aydin Dirican and
                  Nurettin Tan and
                  Martin Margala},
  title        = {A {CMOS} Ripple Detector for Voltage Regulator Testing},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {227--233},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5566-4},
  doi          = {10.1007/S10836-016-5566-4},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/NguyenODTM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/OliveiraS16,
  author       = {Cristina C. Oliveira and
                  Jos{\'{e}} Machado da Silva},
  title        = {Fault Diagnosis in Highly Dependable Medical Wearable Systems},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {467--479},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5602-4},
  doi          = {10.1007/S10836-016-5602-4},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/OliveiraS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PoulosV16,
  author       = {Zissis Poulos and
                  Andreas G. Veneris},
  title        = {Exemplar-based Failure Triage for Regression Design Debugging},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {125--136},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5577-1},
  doi          = {10.1007/S10836-016-5577-1},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/PoulosV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RajiG16,
  author       = {Mohsen Raji and
                  Behnam Ghavami},
  title        = {A Fast Statistical Soft Error Rate Estimation Method for Nano-scale
                  Combinational Circuits},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {291--305},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5583-3},
  doi          = {10.1007/S10836-016-5583-3},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/RajiG16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RenaudBLSMLN16,
  author       = {Guillaume Renaud and
                  Manuel J. Barrag{\'{a}}n and
                  Asma Laraba and
                  Haralampos{-}G. D. Stratigopoulos and
                  Salvador Mir and
                  Herv{\'{e}} Le Gall and
                  Herv{\'{e}} Naudet},
  title        = {A 65nm {CMOS} Ramp Generator Design and its Application Towards a
                  {BIST} Implementation of the Reduced-Code Static Linearity Test Technique
                  for Pipeline ADCs},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {407--421},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5599-8},
  doi          = {10.1007/S10836-016-5599-8},
  timestamp    = {Wed, 28 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/RenaudBLSMLN16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RoyGR16,
  author       = {Surajit Kumar Roy and
                  Chandan Giri and
                  Hafizur Rahaman},
  title        = {Optimization of Test Wrapper for {TSV} Based 3D SOCs},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {511--529},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5610-4},
  doi          = {10.1007/S10836-016-5610-4},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/RoyGR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RuanHWZ16,
  author       = {Aiwu Ruan and
                  Haiyang Huang and
                  Jingwu Wang and
                  Yifan Zhao},
  title        = {A Routability-Aware Algorithm for Both Global and Local Interconnect
                  Resource Test and Diagnosis of Xilinx SRAM-FPGAs},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {749--762},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5622-0},
  doi          = {10.1007/S10836-016-5622-0},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/RuanHWZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SaeediHK16,
  author       = {Ehsan Saeedi and
                  Md. Selim Hossain and
                  Yinan Kong},
  title        = {Side-Channel Information Characterisation Based on Cascade-Forward
                  Back-Propagation Neural Network},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {345--356},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5590-4},
  doi          = {10.1007/S10836-016-5590-4},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/SaeediHK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ShintaniUHMS16,
  author       = {Michihiro Shintani and
                  Takumi Uezono and
                  Kazumi Hatayama and
                  Kazuya Masu and
                  Takashi Sato},
  title        = {Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive
                  Path Delay Testing},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {601--609},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5614-0},
  doi          = {10.1007/S10836-016-5614-0},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/ShintaniUHMS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Streitwieser16,
  author       = {Christian Streitwieser},
  title        = {Real-Time Adaptive Test Algorithm Including Test Escape Estimation
                  Method},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {369--375},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5585-1},
  doi          = {10.1007/S10836-016-5585-1},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Streitwieser16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TangX16,
  author       = {Xiaofeng Tang and
                  Aiqiang Xu},
  title        = {Practical Analog Circuit Diagnosis Based on Fault Features with Minimum
                  Ambiguities},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {83--95},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-015-5561-1},
  doi          = {10.1007/S10836-015-5561-1},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/TangX16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/UygurS16,
  author       = {G{\"{u}}rkan Uygur and
                  Sebastian Sattler},
  title        = {A New Approach for Modeling Inconsistencies in Digital-Assisted Analog
                  Design},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {491--503},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5600-6},
  doi          = {10.1007/S10836-016-5600-6},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/UygurS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VillacortaSC16,
  author       = {Hector Villacorta and
                  Jaume Segura and
                  V{\'{\i}}ctor H. Champac},
  title        = {Impact of Fin-Height on {SRAM} Soft Error Sensitivity and Cell Stability},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {307--314},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5591-3},
  doi          = {10.1007/S10836-016-5591-3},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/VillacortaSC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VohraS16,
  author       = {Harpreet Vohra and
                  Amardeep Singh},
  title        = {Optimal Selective Count Compatible Runlength Encoding for {SOC} Test
                  Data Compression},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {735--747},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5617-x},
  doi          = {10.1007/S10836-016-5617-X},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/VohraS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WaliVBGPR16,
  author       = {Imran Wali and
                  Arnaud Virazel and
                  Alberto Bosio and
                  Patrick Girard and
                  Serge Pravossoudovitch and
                  Matteo Sonza Reorda},
  title        = {A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing
                  Cores},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {147--161},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5578-0},
  doi          = {10.1007/S10836-016-5578-0},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/WaliVBGPR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangLDS0G16,
  author       = {Haibin Wang and
                  Mulong Li and
                  Xixi Dai and
                  Shuting Shi and
                  Li Chen and
                  Gang Guo},
  title        = {Layout-based Single Event Mitigation Techniques for Dynamic Logic
                  Circuits},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {97--103},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-015-5559-8},
  doi          = {10.1007/S10836-015-5559-8},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/WangLDS0G16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16,
  title        = {New Editors - 2016},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {3--5},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5568-2},
  doi          = {10.1007/S10836-016-5568-2},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16a,
  title        = {2015 {JETTA} Reviewers},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {7--8},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5567-3},
  doi          = {10.1007/S10836-016-5567-3},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16b,
  title        = {Test Technology Newsletter},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {9--10},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5564-6},
  doi          = {10.1007/S10836-016-5564-6},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16c,
  title        = {Test Technology Newsletter},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {109--110},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5575-3},
  doi          = {10.1007/S10836-016-5575-3},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16c.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16d,
  title        = {Test Technology Newsletter},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {243--244},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5594-0},
  doi          = {10.1007/S10836-016-5594-0},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16d.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16e,
  title        = {Test Technology Newsletter},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {401--403},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5603-3},
  doi          = {10.1007/S10836-016-5603-3},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16e.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16f,
  title        = {Test Technology Newsletter},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {507--509},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5612-2},
  doi          = {10.1007/S10836-016-5612-2},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16f.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16g,
  title        = {Test Technology Newsletter},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {655--657},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5628-7},
  doi          = {10.1007/S10836-016-5628-7},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16g.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X16h,
  title        = {2015 {JETTA-TTTC} Best Paper Award},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {659--660},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5627-8},
  doi          = {10.1007/S10836-016-5627-8},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/X16h.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YehHW16,
  author       = {Kuen{-}Wei Yeh and
                  Jiun{-}Lang Huang and
                  Laung{-}Terng Wang},
  title        = {{CPP-ATPG:} {A} Circular Pipeline Processing Based Deterministic Parallel
                  Test Pattern Generator},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {625--638},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5615-z},
  doi          = {10.1007/S10836-016-5615-Z},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/YehHW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YuSW16,
  author       = {Wenxin Yu and
                  Yongbo Sui and
                  Junnian Wang},
  title        = {The Faults Diagnostic Analysis for Analog Circuit Based on {FA-TM-ELM}},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {4},
  pages        = {459--465},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5597-x},
  doi          = {10.1007/S10836-016-5597-X},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/YuSW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YuanGSJ16,
  author       = {Haiying Yuan and
                  Kun Guo and
                  Xun Sun and
                  Zijian Ju},
  title        = {A Power Efficient Test Data Compression Method for SoC using Alternating
                  Statistical Run-Length Coding},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {59--68},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5562-8},
  doi          = {10.1007/S10836-016-5562-8},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/YuanGSJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YuanJSGW16,
  author       = {Haiying Yuan and
                  Zijian Ju and
                  Xun Sun and
                  Kun Guo and
                  Xiuyu Wang},
  title        = {Test Data Compression for System-on-chip using Flexible Runs-aware
                  {PRL} Coding},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {639--647},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5595-z},
  doi          = {10.1007/S10836-016-5595-Z},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/YuanJSGW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZamanzadehJ16,
  author       = {Sharareh Zamanzadeh and
                  Ali Jahanian},
  title        = {Security Path: An Emerging Design Methodology to Protect the {FPGA}
                  IPs Against Passive/Active Design Tampering},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {329--343},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5593-1},
  doi          = {10.1007/S10836-016-5593-1},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ZamanzadehJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangHYHXL16,
  author       = {Chaolong Zhang and
                  Yigang He and
                  Lifen Yuan and
                  Wei He and
                  Sheng Xiang and
                  Zhigang Li},
  title        = {A Novel Approach for Diagnosis of Analog Circuit Fault by Using {GMKL-SVM}
                  and {PSO}},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {5},
  pages        = {531--540},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5616-y},
  doi          = {10.1007/S10836-016-5616-Y},
  timestamp    = {Mon, 10 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ZhangHYHXL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhuMXSWHY16,
  author       = {Dongdi Zhu and
                  Jiongjiong Mo and
                  Shiyi Xu and
                  Yong{-}Heng Shang and
                  Zhiyu Wang and
                  Zheng{-}Liang Huang and
                  Fa{-}Xin Yu},
  title        = {A New Capacitance-to-Frequency Converter for On-Chip Capacitance Measurement
                  and Calibration in {CMOS} Technology},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {393--397},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5584-2},
  doi          = {10.1007/S10836-016-5584-2},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ZhuMXSWHY16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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