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@inproceedings{DBLP:conf/itc/AhmadiXNOPM16,
author = {Ali Ahmadi and
Constantinos Xanthopoulos and
Amit Nahar and
Bob Orr and
Michael Pas and
Yiorgos Makris},
title = {Harnessing process variations for optimizing wafer-level probe-test
flow},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805835},
doi = {10.1109/TEST.2016.7805835},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AhmadiXNOPM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AlamTF16,
author = {Md. Mahbub Alam and
Mark M. Tehranipoor and
Domenic Forte},
title = {Recycled {FPGA} detection using exhaustive {LUT} path delay characterization},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805854},
doi = {10.1109/TEST.2016.7805854},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AlamTF16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AmyeenKCNVJGS16,
author = {M. Enamul Amyeen and
Dongok Kim and
Maheshwar Chandrasekar and
Mohammad Noman and
Srikanth Venkataraman and
Anurag Jain and
Neha Goel and
Ramesh Sharma},
title = {A novel diagnostic test generation methodology and its application
in production failure isolation},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805821},
doi = {10.1109/TEST.2016.7805821},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AmyeenKCNVJGS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ArmstrongM16,
author = {Dave Armstrong and
Gary Maier},
title = {Known-good-die test methods for large, thin, high-power digital devices},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805851},
doi = {10.1109/TEST.2016.7805851},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ArmstrongM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AroraABS16,
author = {Shalini Arora and
Aman Aflaki and
Sounil Biswas and
Masashi Shimanouchi},
title = {{SERDES} external loopback test using production parametric-test hardware},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805841},
doi = {10.1109/TEST.2016.7805841},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AroraABS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BanerjeeCA16,
author = {Suvadeep Banerjee and
Abhijit Chatterjee and
Jacob A. Abraham},
title = {Efficient cross-layer concurrent error detection in nonlinear control
systems using mapped predictive check states},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805861},
doi = {10.1109/TEST.2016.7805861},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BanerjeeCA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ButlerND16,
author = {Kenneth M. Butler and
Amit Nahar and
W. Robert Daasch},
title = {What we know after twelve years developing and deploying test data
analytics solutions},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805844},
doi = {10.1109/TEST.2016.7805844},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ButlerND16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaoLWLL16,
author = {Huina Chao and
Huawei Li and
Tiancheng Wang and
Xiaowei Li and
Bo Liu},
title = {An accurate algorithm for computing mutation coverage in model checking},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805864},
doi = {10.1109/TEST.2016.7805864},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChaoLWLL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CoyetteEDVG16,
author = {Anthony Coyette and
Baris Esen and
Wim Dobbelaere and
Ronny Vanhooren and
Georges G. E. Gielen},
title = {Automatic test signal generation for mixed-signal integrated circuits
using circuit partitioning and interval analysis},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805867},
doi = {10.1109/TEST.2016.7805867},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CoyetteEDVG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevanathanK16,
author = {V. R. Devanathan and
Sumant Kale},
title = {A reconfigurable built-in memory self-repair architecture for heterogeneous
cores with embedded {BIST} datapath},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805870},
doi = {10.1109/TEST.2016.7805870},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DevanathanK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DobbelaereVMMCE16,
author = {Wim Dobbelaere and
Ronny Vanhooren and
Willy De Man and
Koen Matthijs and
Anthony Coyette and
Baris Esen and
Georges G. E. Gielen},
title = {Analog fault coverage improvement using final-test dynamic part average
testing},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805829},
doi = {10.1109/TEST.2016.7805829},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DobbelaereVMMCE16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EsenCGDV16,
author = {Baris Esen and
Anthony Coyette and
Georges G. E. Gielen and
Wim Dobbelaere and
Ronny Vanhooren},
title = {Effective {DC} fault models and testing approach for open defects
in analog circuits},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805830},
doi = {10.1109/TEST.2016.7805830},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EsenCGDV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FanVSRJDK16,
author = {Y. Fan and
A. Verma and
Y. Su and
L. Rose and
J. Janney and
V. Do and
S. Kumar},
title = {{RF} test accuracy and capacity enhancement on {ATE} for silicon {TV}
tuners},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805842},
doi = {10.1109/TEST.2016.7805842},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FanVSRJDK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FynanLNMSB16,
author = {Phillip Fynan and
Zeye Liu and
Benjamin Niewenhuis and
Soumya Mittal and
Marcin Strajwas and
R. D. (Shawn) Blanton},
title = {Logic characterization vehicle design reflection via layout rewiring},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805849},
doi = {10.1109/TEST.2016.7805849},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FynanLNMSB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hansen16,
author = {Ken Hansen},
title = {Keynote address Thursday: Addressing semiconductor industry needs:
Defining the future through creative, exciting research},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {11},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805818},
doi = {10.1109/TEST.2016.7805818},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Hansen16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HouCLLKC16,
author = {Chih{-}Sheng Hou and
Yong{-}Xiao Chen and
Jin{-}Fu Li and
Chih{-}Yen Lo and
Ding{-}Ming Kwai and
Yung{-}Fa Chou},
title = {A built-in self-repair scheme for DRAMs with spare rows, columns,
and bits},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805832},
doi = {10.1109/TEST.2016.7805832},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HouCLLKC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsuSSLCSC16,
author = {Chun{-}Kai Hsu and
Peter Sarson and
Gregor Schatzberger and
Friedrich Peter Leisenberger and
John M. Carulli Jr. and
Siddhartha Siddhartha and
Kwang{-}Ting Cheng},
title = {Variation and failure characterization through pattern classification
of test data from multiple test stages},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805845},
doi = {10.1109/TEST.2016.7805845},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HsuSSLCSC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JagannadhaYSCSB16,
author = {Pavan Kumar Datla Jagannadha and
Mahmut Yilmaz and
Milind Sonawane and
Sailendra Chadalavada and
Shantanu Sarangi and
Bonita Bhaskaran and
Ayub Abdollahian},
title = {Advanced test methodology for complex SoCs},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805857},
doi = {10.1109/TEST.2016.7805857},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/JagannadhaYSCSB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG16,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Accurate anomaly detection using correlation-based time-series analysis
in a core router system},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805836},
doi = {10.1109/TEST.2016.7805836},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JohnsonNJCMD16,
author = {Michael Johnson and
Brian Noble and
Mark Johnson and
Jim Crafts and
Cynthia Manya and
John Deforge},
title = {Active reliability monitor: Defect level extrinsic reliability monitoring
on 22nm {POWER8} and zSeries processors},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805871},
doi = {10.1109/TEST.2016.7805871},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/JohnsonNJCMD16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KadamRCA16,
author = {Gurunath Kadam and
Markus Rudack and
Krishnendu Chakrabarty and
Juergen Alt},
title = {Supply-voltage optimization to account for process variations in high-volume
manufacturing testing},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805846},
doi = {10.1109/TEST.2016.7805846},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KadamRCA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KelirisSCKMK16,
author = {Anastasis Keliris and
Hossein Salehghaffari and
Brian R. Cairl and
Prashanth Krishnamurthy and
Michail Maniatakos and
Farshad Khorrami},
title = {Machine learning-based defense against process-aware attacks on Industrial
Control Systems},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805855},
doi = {10.1109/TEST.2016.7805855},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KelirisSCKMK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduBK16,
author = {Subhadip Kundu and
Parthajit Bhattacharya and
Rohit Kapur},
title = {Handling wrong mapping: {A} new direction towards better diagnosis
with low pin convolution compressors},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805822},
doi = {10.1109/TEST.2016.7805822},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KunduBK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeTK16,
author = {Kuen{-}Jong Lee and
Pin{-}Hao Tang and
Michael A. Kochte},
title = {An on-chip self-test architecture with test patterns recorded in scan
chains},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805865},
doi = {10.1109/TEST.2016.7805865},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LeeTK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiJLXC16,
author = {Tianjian Li and
Li Jiang and
Xiaoyao Liang and
Qiang Xu and
Krishnendu Chakrabarty},
title = {Defect tolerance for CNFET-based SRAMs},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805833},
doi = {10.1109/TEST.2016.7805833},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiJLXC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiLYCHL16,
author = {Zipeng Li and
Kelvin Yi{-}Tse Lai and
Po{-}Hsien Yu and
Krishnendu Chakrabarty and
Tsung{-}Yi Ho and
Chen{-}Yi Lee},
title = {Built-in self-test for micro-electrode-dot-array digital microfluidic
biochips},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805847},
doi = {10.1109/TEST.2016.7805847},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiLYCHL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LienL16,
author = {Wei{-}Cheng Lien and
Kuen{-}Jong Lee},
title = {Output bit selection methodology for test response compaction},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805873},
doi = {10.1109/TEST.2016.7805873},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LienL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LimX0BA16,
author = {Carlston Lim and
Yang Xue and
Xin Li and
Ronald D. Blanton and
M. Enamul Amyeen},
title = {Diagnostic resolution improvement through learning-guided physical
failure analysis},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805824},
doi = {10.1109/TEST.2016.7805824},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LimX0BA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuMMRRT16,
author = {Yingdi Liu and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Sudhakar M. Reddy and
Janusz Rajski and
Jerzy Tyszer},
title = {Minimal area test points for deterministic patterns},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805825},
doi = {10.1109/TEST.2016.7805825},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuMMRRT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MittalLNB16,
author = {Soumya Mittal and
Zeye Liu and
Ben Niewenhuis and
R. D. (Shawn) Blanton},
title = {Test chip design for optimal cell-aware diagnosability},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805850},
doi = {10.1109/TEST.2016.7805850},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MittalLNB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoghaddamMRTZ16,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Test point insertion in hybrid test compression/LBIST architectures},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805826},
doi = {10.1109/TEST.2016.7805826},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoghaddamMRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MuldreyDC16,
author = {Barry John Muldrey and
Sabyasachi Deyati and
Abhijit Chatterjee},
title = {{DE-LOC:} Design validation and debugging under limited observation
and control, pre- and post-silicon for mixed-signal systems},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805868},
doi = {10.1109/TEST.2016.7805868},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MuldreyDC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MurakamiKMKMK16,
author = {Masahiro Murakami and
Haruo Kobayashi and
Shaiful Nizam Bin Mohyar and
Osamu Kobayashi and
Takahiro Miki and
Junya Kojima},
title = {{I-Q} signal generation techniques for communication {IC} testing
and {ATE} systems},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805858},
doi = {10.1109/TEST.2016.7805858},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MurakamiKMKMK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NakamuraA16,
author = {Takayuki Nakamura and
Koji Asami},
title = {Novel crosstalk evaluation method for high-density signal traces using
clock waveform conversion technique},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805859},
doi = {10.1109/TEST.2016.7805859},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NakamuraA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NakuraTIIKIA16,
author = {Toru Nakura and
Naoki Terao and
Masahiro Ishida and
Rimon Ikeno and
Takashi Kusaka and
Tetsuya Iizuka and
Kunihiro Asada},
title = {Power supply impedance emulation to eliminate overkills and underkills
due to the impedance difference between {ATE} and customer board},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805860},
doi = {10.1109/TEST.2016.7805860},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NakuraTIIKIA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PanDSCFBC16,
author = {Yan Pan and
Rao Desineni and
Kannan Sekar and
Atul Chittora and
Sherwin Fernandes and
Neerja Bawaskar and
John M. Carulli},
title = {Pylon: Towards an integrated customizable volume diagnosis infrastructure},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805872},
doi = {10.1109/TEST.2016.7805872},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/PanDSCFBC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Papavramidou16,
author = {Panagiota Papavramidou},
title = {Memory repair for high fault rates},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805874},
doi = {10.1109/TEST.2016.7805874},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Papavramidou16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Portolan16,
author = {Michele Portolan},
title = {Accessing 1687 systems using arbitrary protocols},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805839},
doi = {10.1109/TEST.2016.7805839},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Portolan16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rhines16,
author = {Walden C. Rhines},
title = {Plenary keynote address Tuesday: The business of test: Test and semiconductor
economics},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805816},
doi = {10.1109/TEST.2016.7805816},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Rhines16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Roberts16,
author = {Gordon W. Roberts},
title = {Mixed-signal {ATE} technology and its impact on today's electronic
system},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805852},
doi = {10.1109/TEST.2016.7805852},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Roberts16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rutenbar16,
author = {Rob A. Rutenbar},
title = {Keynote address Wednesday: Hardware inference accelerators for machine
learning},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805817},
doi = {10.1109/TEST.2016.7805817},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Rutenbar16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SadiCTCWT16,
author = {Mehdi Sadi and
Gustavo K. Contreras and
Dat Tran and
Jifeng Chen and
LeRoy Winemberg and
Mark M. Tehranipoor},
title = {{BIST-RM:} BIST-assisted reliability management of SoCs using on-chip
clock sweeping and machine learning},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805862},
doi = {10.1109/TEST.2016.7805862},
timestamp = {Tue, 30 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SadiCTCWT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaleemT16,
author = {Kamran Saleem and
Nur A. Touba},
title = {Using symbolic canceling to improve diagnosis from compacted response},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805823},
doi = {10.1109/TEST.2016.7805823},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SaleemT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sarson16,
author = {Peter Sarson},
title = {Test time efficient group delay filter characterization technique
using a discrete chirped excitation signal},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805853},
doi = {10.1109/TEST.2016.7805853},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Sarson16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SequeiraNGC16,
author = {Jyotsna Sequeira and
Suriyaprakash Natarajan and
Prashant Goteti and
Nitin Chaudhary},
title = {Fault simulation for analog test coverage},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805831},
doi = {10.1109/TEST.2016.7805831},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SequeiraNGC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShawHBN16,
author = {David Shaw and
Dirk Hoops and
Kenneth M. Butler and
Amit Nahar},
title = {Statistical outlier screening as a test solution health monitor},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805837},
doi = {10.1109/TEST.2016.7805837},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ShawHBN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterVM16,
author = {Stephen Sunter and
Alessandro Valerio and
Riccardo Miglierina},
title = {Automated measurement of defect tolerance in mixed-signal ICs},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805869},
doi = {10.1109/TEST.2016.7805869},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SunterVM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TangKIC16,
author = {Jack Tang and
Ramesh Karri and
Mohamed Ibrahim and
Krishnendu Chakrabarty},
title = {Securing digital microfluidic biochips by randomizing checkpoints},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805856},
doi = {10.1109/TEST.2016.7805856},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TangKIC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsertovJDRLZCMK16,
author = {Anton Tsertov and
Artur Jutman and
Sergei Devadze and
Matteo Sonza Reorda and
Erik Larsson and
Farrokh Ghani Zadegan and
Riccardo Cantoro and
Mehrdad Montazeri and
Rene Krenz{-}Baath},
title = {A suite of {IEEE} 1687 benchmark networks},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805840},
doi = {10.1109/TEST.2016.7805840},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsertovJDRLZCMK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ValleroSPCCTKGR16,
author = {Alessandro Vallero and
Alessandro Savino and
Gianfranco Politano and
Stefano Di Carlo and
Athanasios Chatzidimitriou and
Sotiris Tselonis and
Manolis Kaliorakis and
Dimitris Gizopoulos and
Marc Riera and
Ramon Canal and
Antonio Gonz{\'{a}}lez and
Maha Kooli and
Alberto Bosio and
Giorgio Di Natale},
title = {Cross-layer system reliability assessment framework for hardware faults},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805863},
doi = {10.1109/TEST.2016.7805863},
timestamp = {Sun, 02 Jun 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ValleroSPCCTKGR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangC16,
author = {Ran Wang and
Krishnendu Chakrabarty},
title = {Testing of interposer-based 2.5D integrated circuits},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805875},
doi = {10.1109/TEST.2016.7805875},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuL16,
author = {Cheng{-}Hung Wu and
Kuen{-}Jong Lee},
title = {Transformation of multiple fault models to a unified model for {ATPG}
efficiency enhancement},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805866},
doi = {10.1109/TEST.2016.7805866},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WuL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XiangCF16,
author = {Dong Xiang and
Krishnendu Chakrabarty and
Hideo Fujiwara},
title = {A unified test and fault-tolerant multicast solution for network-on-chip
designs},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805827},
doi = {10.1109/TEST.2016.7805827},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XiangCF16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YoonCR16,
author = {Insik Yoon and
Ashwin Chintaluri and
Arijit Raychowdhury},
title = {{EMACS:} Efficient {MBIST} architecture for test and characterization
of {STT-MRAM} arrays},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805834},
doi = {10.1109/TEST.2016.7805834},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/YoonCR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZadeganKL16,
author = {Farrokh Ghani Zadegan and
Rene Krenz{-}Baath and
Erik Larsson},
title = {Upper-bound computation for optimal retargeting in {IEEE1687} networks},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805838},
doi = {10.1109/TEST.2016.7805838},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZadeganKL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangHSGASWD16,
author = {Fanchen Zhang and
Daphne Hwong and
Yi Sun and
Allison Garcia and
Soha Alhelaly and
Geoff Shofner and
LeRoy Winemberg and
Jennifer Dworak},
title = {Putting wasted clock cycles to use: Enhancing fortuitous cell-aware
fault detection with scan shift capture},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805828},
doi = {10.1109/TEST.2016.7805828},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ZhangHSGASWD16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhengHLWTC16,
author = {Chih{-}Chieh Zheng and
Shi{-}Yu Huang and
Shyue{-}Kung Lu and
Ting{-}Chi Wang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng},
title = {Online slack-time binning for IO-registered die-to-die interconnects},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805848},
doi = {10.1109/TEST.2016.7805848},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ZhengHLWTC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhuangUJSMC16,
author = {Yuming Zhuang and
Akhilesh Kesavan Unnithan and
Arun Joseph and
Siva Sudani and
Benjamin Magstadt and
Degang Chen},
title = {Low cost ultra-pure sine wave generation with self calibration},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805843},
doi = {10.1109/TEST.2016.7805843},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ZhuangUJSMC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2016,
title = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
publisher = {{IEEE}},
year = {2016},
url = {https://ieeexplore.ieee.org/xpl/conhome/7794484/proceeding},
isbn = {978-1-4673-8773-6},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2016.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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