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@inproceedings{DBLP:conf/ats/0001BFS19,
author = {Binod Kumar and
Atul Kumar Bhosale and
Masahiro Fujita and
Virendra Singh},
title = {Validating Multi-Processor Cache Coherence Mechanisms under Diminished
Observability},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {99--104},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00019},
doi = {10.1109/ATS47505.2019.00019},
timestamp = {Tue, 14 Jan 2020 13:20:27 +0100},
biburl = {https://dblp.org/rec/conf/ats/0001BFS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AraujoPMFK19,
author = {Leandro Santiago de Ara{\'{u}}jo and
Vinay C. Patil and
Leandro Augusto Justen Marzulo and
Felipe Maia Galv{\~{a}}o Fran{\c{c}}a and
Sandip Kundu},
title = {Efficient Testing of Physically Unclonable Functions for Uniqueness},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {117--122},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00022},
doi = {10.1109/ATS47505.2019.00022},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AraujoPMFK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChakrabortyAM19,
author = {Anirban Chakraborty and
Manaar Alam and
Debdeep Mukhopadhyay},
title = {Deep Learning Based Diagnostics for Rowhammer Protection of {DRAM}
Chips},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {86--91},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00016},
doi = {10.1109/ATS47505.2019.00016},
timestamp = {Tue, 25 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChakrabortyAM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChattopadhyayKR19,
author = {Saranyu Chattopadhyay and
Preeti Kumari and
Biswajit Ray and
Rajat Subhra Chakraborty},
title = {Machine Learning Assisted Accurate Estimation of Usage Duration and
Manufacturer for Recycled and Counterfeit Flash Memory Detection},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {49--54},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-1},
doi = {10.1109/ATS47505.2019.000-1},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChattopadhyayKR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenH19,
author = {Ching{-}Yuan Chen and
Jiun{-}Lang Huang},
title = {Reinforcement-Learning-Based Test Program Generation for Software-Based
Self-Test},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {73--78},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00013},
doi = {10.1109/ATS47505.2019.00013},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChooOIIMDKH19,
author = {Hau Sim Choo and
Chia Yee Ooi and
Michiko Inoue and
Nordinah Ismail and
Mehrdad Moghbel and
Sreedharan Baskara Dass and
Chee Hoo Kok and
Fawnizu Azmadi Hussin},
title = {Machine-Learning-Based Multiple Abstraction-Level Detection of Hardware
Trojan Inserted at Register-Transfer Level},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {98},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00018},
doi = {10.1109/ATS47505.2019.00018},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChooOIIMDKH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChoudhuryMS19,
author = {Avishek Choudhury and
Brototi Mondal and
Biplab K. Sikdar},
title = {Latency Aware Fault Tolerant Cache in Multicore Using Dynamic Remapping
Clusters},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {79},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00014},
doi = {10.1109/ATS47505.2019.00014},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChoudhuryMS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DebD19,
author = {Arighna Deb and
Debesh K. Das},
title = {Detailed Fault Model for Physical Quantum Circuits},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {153--158},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00028},
doi = {10.1109/ATS47505.2019.00028},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DebD19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DrechlserG19,
author = {Rolf Drechsler and
Daniel Gro{\ss}e},
title = {Ensuring Correctness of Next Generation Devices: From Reconfigurable
to Self-Learning Systems},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {159--164},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00029},
doi = {10.1109/ATS47505.2019.00029},
timestamp = {Thu, 25 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DrechlserG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GhoshMCRG19,
author = {Sourav Ghosh and
Dolan Maity and
Arijit Chowdhury and
Surajit Kumar Roy and
Chandan Giri},
title = {Iterative Parallel Test to Detect and Diagnose Multiple Defects for
Digital Microfluidic Biochip},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {147--152},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00027},
doi = {10.1109/ATS47505.2019.00027},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GhoshMCRG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HiramotoOT19,
author = {Yushiro Hiramoto and
Satoshi Ohtake and
Hiroshi Takahashi},
title = {A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation
of Expected Signatures},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {31--36},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-4},
doi = {10.1109/ATS47505.2019.000-4},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HiramotoOT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Huang19,
author = {Tsung{-}Chu Huang},
title = {Self-Checking Residue Number System for Low-Power Reliable Neural
Network},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {37--42},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-3},
doi = {10.1109/ATS47505.2019.000-3},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Huang19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KokOIMDCIH19,
author = {Chee Hoo Kok and
Chia Yee Ooi and
Michiko Inoue and
Mehrdad Moghbel and
Sreedharan Baskara Dass and
Hau Sim Choo and
Nordinah Ismail and
Fawnizu Azmadi Hussin},
title = {Net Classification Based on Testability and Netlist Structural Features
for Hardware Trojan Detection},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {105--110},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00020},
doi = {10.1109/ATS47505.2019.00020},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/KokOIMDCIH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarDKKCM19,
author = {Vinay B. Y. Kumar and
Suman Deb and
Rupesh Kumar and
Mustafa Khairallah and
Anupam Chattopadhyay and
Avi Mendelson},
title = {Recruiting Fault Tolerance Techniques for Microprocessor Security},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {80--85},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00015},
doi = {10.1109/ATS47505.2019.00015},
timestamp = {Sun, 12 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarDKKCM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuSSL019,
author = {Renjie Lu and
Haihua Shen and
Yu Su and
Huawei Li and
Xiaowei Li},
title = {GramsDet: Hardware Trojan Detection Based on Recurrent Neural Network},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {111--116},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00021},
doi = {10.1109/ATS47505.2019.00021},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LuSSL019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MillicanSRA19,
author = {Spencer K. Millican and
Yang Sun and
Soham Roy and
Vishwani D. Agrawal},
title = {Applying Neural Networks to Delay Fault Testing: Test Point Insertion
and Random Circuit Training},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {13--18},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-7},
doi = {10.1109/ATS47505.2019.000-7},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MillicanSRA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MomtazC19,
author = {Md Imran Momtaz and
Abhijit Chatterjee},
title = {Hierarchical State Space Checks for Errors in Sensors, Actuators and
Control of Nonlinear Systems: Diagnosis and Compensation},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {141--146},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00026},
doi = {10.1109/ATS47505.2019.00026},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MomtazC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MondalCPSB19,
author = {Manobendra Nath Mondal and
Animesh Basak Chowdhury and
Manjari Pradhan and
Susmita Sur{-}Kolay and
Bhargab B. Bhattacharya},
title = {Fault Coverage of a Test Set on Structure-Preserving Siblings of a
Circuit-Under-Test},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {25--30},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-5},
doi = {10.1109/ATS47505.2019.000-5},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MondalCPSB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MuduliS19,
author = {Sujit Kumar Muduli and
Pramod Subramanyan},
title = {Towards Verifiably Secure Systems-on-Chip Platforms},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {92--97},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00017},
doi = {10.1109/ATS47505.2019.00017},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MuduliS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OzenO19,
author = {Elbruz Ozen and
Alex Orailoglu},
title = {Sanity-Check: Boosting the Reliability of Safety-Critical Deep Neural
Network Applications},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {7--12},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-8},
doi = {10.1109/ATS47505.2019.000-8},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/OzenO19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RohanBK19,
author = {Aditya Rohan and
Kanad Basu and
Ramesh Karri},
title = {Can Monitoring System State + Counting Custom Instruction Sequences
Aid Malware Detection?},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {61--66},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00007},
doi = {10.1109/ATS47505.2019.00007},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/RohanBK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/S0SJBS19,
author = {Vineesh V. S. and
Binod Kumar and
Rushikesh Shinde and
Akshay Jaiswal and
Harsh Bhargava and
Virendra Singh},
title = {Orion: {A} Technique to Prune State Space Search Directions for Guidance-Based
Formal Verification},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {123--128},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00023},
doi = {10.1109/ATS47505.2019.00023},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/S0SJBS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SanyalPDB19,
author = {Sayandeep Sanyal and
Amit Patra and
Pallab Dasgupta and
Mayukh Bhattacharya},
title = {A Structured Approach for Rapid Identification of Fault-Sensitive
Nets in Analog Circuits},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {135--140},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00025},
doi = {10.1109/ATS47505.2019.00025},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SanyalPDB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SilvaBH019,
author = {Felipe Augusto da Silva and
Ahmet Cagri Bagbaba and
Said Hamdioui and
Christian Sauer},
title = {Combining Fault Analysis Technologies for {ISO26262} Functional Safety
Verification},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {129--134},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00024},
doi = {10.1109/ATS47505.2019.00024},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/SilvaBH019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangWTCLKP19,
author = {Naixing Wang and
Chen Wang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng and
Xijiang Lin and
Mark Kassab and
Irith Pomeranz},
title = {{TEA:} {A} Test Generation Algorithm for Designs with Timing Exceptions},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {19--24},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-6},
doi = {10.1109/ATS47505.2019.000-6},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/WangWTCLKP19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Wu0LCVRHY19,
author = {Cheng{-}Hung Wu and
Yu Huang and
Kuen{-}Jong Lee and
Wu{-}Tung Cheng and
Gaurav Veda and
Sudhakar M. Reddy and
Chun{-}Cheng Hu and
Chong{-}Siao Ye},
title = {Deep Learning Based Test Compression Analyzer},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-9},
doi = {10.1109/ATS47505.2019.000-9},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/Wu0LCVRHY19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanWLCSY0W19,
author = {Aibin Yan and
Zhen Wu and
Lu Lu and
Zhili Chen and
Jie Song and
Zuobin Ying and
Patrick Girard and
Xiaoqing Wen},
title = {Novel Radiation Hardened Latch Design with Cost-Effectiveness for
Safety-Critical Terrestrial Applications},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {43--48},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-2},
doi = {10.1109/ATS47505.2019.000-2},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanWLCSY0W19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanWZHCYW019,
author = {Aibin Yan and
Zhen Wu and
Jun Zhou and
Yuanjie Hu and
Yan Chen and
Zuobin Ying and
Xiaoqing Wen and
Patrick Girard},
title = {Design of a Sextuple Cross-Coupled {SRAM} Cell with Optimized Access
Operations for Highly Reliable Terrestrial Applications},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {55--60},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00006},
doi = {10.1109/ATS47505.2019.00006},
timestamp = {Mon, 11 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YanWZHCYW019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2019,
title = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
publisher = {{IEEE}},
year = {2019},
url = {https://ieeexplore.ieee.org/xpl/conhome/8942393/proceeding},
isbn = {978-1-7281-2695-1},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/2019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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