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@article{DBLP:journals/et/Agrawal96,
  author       = {Vishwani D. Agrawal},
  title        = {Editorial},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {111},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341817},
  doi          = {10.1007/BF02341817},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Agrawal96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/BoubezariK96,
  author       = {Samir Boubezari and
                  Bozena Kaminska},
  title        = {A new reconfigurable Test Vector Generator for built-in self-test
                  applications},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {153--164},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341821},
  doi          = {10.1007/BF02341821},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/BoubezariK96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/BrzozowskiJ96,
  author       = {Janusz A. Brzozowski and
                  Helmut J{\"{u}}rgensen},
  title        = {An algebra of multiple faults in RAMs},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {129--142},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341819},
  doi          = {10.1007/BF02341819},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/BrzozowskiJ96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/CaunegreA96,
  author       = {Pascal Caunegre and
                  Claude Abraham},
  title        = {Fault simulation for mixed-signal systems},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {143--152},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341820},
  doi          = {10.1007/BF02341820},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CaunegreA96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ChakrabartyH96,
  author       = {Krishnendu Chakrabarty and
                  John P. Hayes},
  title        = {Balance testing and balance-testable design of logic circuits},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {1},
  pages        = {71--86},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00136077},
  doi          = {10.1007/BF00136077},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/ChakrabartyH96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ChakravartyGV96,
  author       = {Sreejit Chakravarty and
                  Yiming Gong and
                  Srikanth Venkataraman},
  title        = {Diagnostic simulation of stuck-at faults in combinational circuits},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {1},
  pages        = {87--97},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00136078},
  doi          = {10.1007/BF00136078},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ChakravartyGV96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ChakravartyT96,
  author       = {Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {Algorithms to select \emph{I}\({}_{\mbox{DDQ}}\) measurement points
                  to detect bridging faults},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {3},
  pages        = {275--285},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00133389},
  doi          = {10.1007/BF00133389},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ChakravartyT96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ChenB96,
  author       = {Xinghao Chen and
                  Michael L. Bushnell},
  title        = {Sequential circuit test generation using dynamic justification equivalence},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {1},
  pages        = {9--33},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00136073},
  doi          = {10.1007/BF00136073},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ChenB96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/CoorayC96,
  author       = {Niranjan L. Cooray and
                  Edward W. Czeck},
  title        = {Guaranteed fault detection sequences for single transition faults
                  in finite state machine models using concurrent fault simulation},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {3},
  pages        = {261--273},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00133388},
  doi          = {10.1007/BF00133388},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CoorayC96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/GizopoulosNPH96,
  author       = {Dimitris Gizopoulos and
                  Dimitris Nikolos and
                  Antonis M. Paschalis and
                  Constantin Halatsis},
  title        = {\emph{C}-Testable modified-Booth multipliers},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {3},
  pages        = {241--260},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00133387},
  doi          = {10.1007/BF00133387},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/GizopoulosNPH96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/GosselS96,
  author       = {Michael G{\"{o}}ssel and
                  Egor S. Sogomonyan},
  title        = {A parity-preserving multi-input signature analyzer and its application
                  for concurrent checking and {BIST}},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {165--177},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341822},
  doi          = {10.1007/BF02341822},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/GosselS96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Hirabayashi96,
  author       = {Kanji Hirabayashi},
  title        = {Hazard simulation of sequential circuits},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {215--217},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341825},
  doi          = {10.1007/BF02341825},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Hirabayashi96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/McNamerN96,
  author       = {Michael G. McNamer and
                  H. Troy Nagle},
  title        = {{ITA:} An algorithm for \emph{I}\({}_{\mbox{DDQ}}\) testability analysis},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {3},
  pages        = {287--298},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00133390},
  doi          = {10.1007/BF00133390},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/McNamerN96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ParekhjiVS96,
  author       = {Rubin A. Parekhji and
                  G. Venkatesh and
                  Sunil D. Sherlekar},
  title        = {Monitoring machine based synthesis technique for concurrent error
                  detection in finite state machines},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {179--201},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341823},
  doi          = {10.1007/BF02341823},
  timestamp    = {Thu, 19 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/ParekhjiVS96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Rodriguez-MontanesBF96,
  author       = {Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
                  E. M. J. G. Bruls and
                  Joan Figueras},
  title        = {Bridging defects resistance in the metal layer of a {CMOS} process},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {1},
  pages        = {35--46},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00136074},
  doi          = {10.1007/BF00136074},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Rodriguez-MontanesBF96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Sachdev96,
  author       = {Manoj Sachdev},
  title        = {Separate\emph{I}\({}_{\mbox{DDQ}}\) testing of signal and bias paths
                  in {CMOS} ICs for defect diagnosis},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {203--214},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341824},
  doi          = {10.1007/BF02341824},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Sachdev96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/SeguraBRH96,
  author       = {Jaume Segura and
                  Carol de Benito and
                  Antonio Rubio and
                  Charles F. Hawkins},
  title        = {A detailed analysis and electrical modeling of gate oxide shorts in
                  {MOS} transistors},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {3},
  pages        = {229--239},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00133386},
  doi          = {10.1007/BF00133386},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/SeguraBRH96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/VoyiatzisPNH96,
  author       = {Ioannis Voyiatzis and
                  Antonis M. Paschalis and
                  Dimitris Nikolos and
                  Constantin Halatsis},
  title        = {An efficient built-in self test method for robust path delay fault
                  testing},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {219--222},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341826},
  doi          = {10.1007/BF02341826},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/VoyiatzisPNH96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/WahbaB96,
  author       = {Ayman M. Wahba and
                  Dominique Borrione},
  title        = {A method for automatic design error location and correction in combinational
                  logic circuits},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {113--127},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341818},
  doi          = {10.1007/BF02341818},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/WahbaB96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/WesselsM96,
  author       = {David Wessels and
                  Jon C. Muzio},
  title        = {The dangers of simplistic delay models},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {1},
  pages        = {61--69},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00136076},
  doi          = {10.1007/BF00136076},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/WesselsM96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ZhangMB96,
  author       = {Zaifu Zhang and
                  Robert D. McLeod and
                  Gregory E. Bridges},
  title        = {Statistical estimation of delay fault detectabilities and fault grading},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {1},
  pages        = {47--60},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00136075},
  doi          = {10.1007/BF00136075},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ZhangMB96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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