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@article{DBLP:journals/et/AbdullaRK98,
author = {Mohammed Fadle Abdulla and
C. P. Ravikumar and
Anshul Kumar},
title = {Optimization of Mutual and Signature Testing Schemes for Highly Concurrent
Systems},
journal = {J. Electron. Test.},
volume = {12},
number = {3},
pages = {199--216},
year = {1998},
url = {https://doi.org/10.1023/A:1008272532719},
doi = {10.1023/A:1008272532719},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AbdullaRK98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal98,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {5},
year = {1998},
url = {https://doi.org/10.1023/A:1008269530718},
doi = {10.1023/A:1008269530718},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal98a,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {12},
number = {3},
pages = {167},
year = {1998},
url = {https://doi.org/10.1023/A:1008240830902},
doi = {10.1023/A:1008240830902},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal98a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AktoufRMM98,
author = {Chouki Aktouf and
Chantal Robach and
A. Marinescu and
Guy Mazar{\'{e}}},
title = {An Implementation Approach of the {IEEE} 1149.1 for the Routing Test
of a {VLSI} Massively Parallel Architecture},
journal = {J. Electron. Test.},
volume = {12},
number = {3},
pages = {171--185},
year = {1998},
url = {https://doi.org/10.1023/A:1008216431810},
doi = {10.1023/A:1008216431810},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AktoufRMM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Al-AsaadHM98,
author = {Hussain Al{-}Asaad and
John P. Hayes and
Brian T. Murray},
title = {Scalable Test Generators for High-Speed Datapath Circuits},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {111--125},
year = {1998},
url = {https://doi.org/10.1023/A:1008242108853},
doi = {10.1023/A:1008242108853},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Al-AsaadHM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ArabiK98,
author = {Karim Arabi and
Bozena Kaminska},
title = {Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic
Structures},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {93--99},
year = {1998},
url = {https://doi.org/10.1023/A:1008285907945},
doi = {10.1023/A:1008285907945},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ArabiK98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DuarteNBZ98,
author = {Ricardo de Oliveira Duarte and
Michael Nicolaidis and
Hakim Bederr and
Yervant Zorian},
title = {Efficient Totally Self-Checking Shifter Design},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {29--39},
year = {1998},
url = {https://doi.org/10.1023/A:1008253000676},
doi = {10.1023/A:1008253000676},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DuarteNBZ98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HellebrandWH98,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Andre Hertwig},
title = {Mixed-Mode {BIST} Using Embedded Processors},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {127--138},
year = {1998},
url = {https://doi.org/10.1023/A:1008294125692},
doi = {10.1023/A:1008294125692},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HellebrandWH98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Levendel98,
author = {Ytzhak H. Levendel},
title = {Delivering Dependable Telecommunication Services Using Off-the-Shelf
System Components},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {153--159},
year = {1998},
url = {https://doi.org/10.1023/A:1008250310670},
doi = {10.1023/A:1008250310670},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Levendel98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MorenoIRSI98,
author = {Eugenio Garc{\'{\i}}a{-}Moreno and
Benjam{\'{\i}}n I{\~{n}}{\'{\i}}guez and
Miquel Roca and
Jaume Segura and
Eugeni Isern},
title = {Clocked Dosimeter Compatible with Digital {CMOS} Technology},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {101--110},
year = {1998},
url = {https://doi.org/10.1023/A:1008290024783},
doi = {10.1023/A:1008290024783},
timestamp = {Wed, 20 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MorenoIRSI98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NicolaidisZ98,
author = {Michael Nicolaidis and
Yervant Zorian},
title = {On-Line Testing for {VLSI} - {A} Compendium of Approaches},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {7--20},
year = {1998},
url = {https://doi.org/10.1023/A:1008244815697},
doi = {10.1023/A:1008244815697},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NicolaidisZ98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Nikolos98,
author = {Dimitris Nikolos},
title = {Self-Testing Embedded Two-Rail Checkers},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {69--79},
year = {1998},
url = {https://doi.org/10.1023/A:1008281822966},
doi = {10.1023/A:1008281822966},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Nikolos98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/OlivoD98,
author = {Piero Olivo and
Marcello Dalpasso},
title = {A Bist Scheme for Non-Volatile Memories},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {139--144},
year = {1998},
url = {https://doi.org/10.1023/A:1008246209762},
doi = {10.1023/A:1008246209762},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/OlivoD98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Orailoglu98,
author = {Alex Orailoglu},
title = {On-Line Fault Resilience Through Gracefully Degradable ASICs},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {145--151},
year = {1998},
url = {https://doi.org/10.1023/A:1008298226600},
doi = {10.1023/A:1008298226600},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Orailoglu98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PappuBAM98,
author = {Lakshminarayana Pappu and
Michael L. Bushnell and
Vishwani D. Agrawal and
Mandyam{-}Komar Srinivas},
title = {Statistical Delay Fault Coverage Estimation for Synchronous Sequential
Circuits},
journal = {J. Electron. Test.},
volume = {12},
number = {3},
pages = {239--254},
year = {1998},
url = {https://doi.org/10.1023/A:1008228817698},
doi = {10.1023/A:1008228817698},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PappuBAM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PaschalisGG98,
author = {Antonis M. Paschalis and
Dimitris Gizopoulos and
Nikolaos Gaitanis},
title = {Concurrent Delay Testing in Totally Self-Checking Systems},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {55--61},
year = {1998},
url = {https://doi.org/10.1023/A:1008213304310},
doi = {10.1023/A:1008213304310},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PaschalisGG98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Piestrak98,
author = {Stanislaw J. Piestrak},
title = {Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel
Counters},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {63--68},
year = {1998},
url = {https://doi.org/10.1023/A:1008273606127},
doi = {10.1023/A:1008273606127},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Piestrak98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SahraouiCSM98,
author = {Zohair Sahraoui and
Francky Catthoor and
Paul Six and
Hugo De Man},
title = {Techniques for Reducing the Number of Decisions and Backtracks in
Combinational Test Generation},
journal = {J. Electron. Test.},
volume = {12},
number = {3},
pages = {217--238},
year = {1998},
url = {https://doi.org/10.1023/A:1008224716789},
doi = {10.1023/A:1008224716789},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SahraouiCSM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SaposhnikovMSG98,
author = {Valerij V. Saposhnikov and
Andrej A. Morosov and
Vladimir V. Saposhnikov and
Michael G{\"{o}}ssel},
title = {A New Design Method for Self-Checking Unidirectional Combinational
Circuits},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {41--53},
year = {1998},
url = {https://doi.org/10.1023/A:1008257118423},
doi = {10.1023/A:1008257118423},
timestamp = {Fri, 04 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/SaposhnikovMSG98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Stiffler98,
author = {Jack J. Stiffler},
title = {On-Line Fault Monitoring},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {21--27},
year = {1998},
url = {https://doi.org/10.1023/A:1008201032535},
doi = {10.1023/A:1008201032535},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Stiffler98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SzekelyRKLC98,
author = {Vladim{\'{\i}}r Sz{\'{e}}kely and
M{\'{a}}rta Rencz and
Jean{-}Michel Karam and
Marcelo Lubaszewski and
Bernard Courtois},
title = {Thermal Monitoring of Self-Checking Systems},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {81--92},
year = {1998},
url = {https://doi.org/10.1023/A:1008233907036},
doi = {10.1023/A:1008233907036},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SzekelyRKLC98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangZ98,
author = {De{-}Qiang Wang and
Lian{-}Chang Zhao},
title = {Combinatorial Analysis of Check Set Construction for Algorithm-Based
Fault Tolerance Systems},
journal = {J. Electron. Test.},
volume = {12},
number = {3},
pages = {255--260},
year = {1998},
url = {https://doi.org/10.1023/A:1008280801768},
doi = {10.1023/A:1008280801768},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WangZ98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YeandelTJ98,
author = {J. Yeandel and
D. Thulborn and
Simon Jones},
title = {The Design and Implementation of an On-Line Testable {UART}},
journal = {J. Electron. Test.},
volume = {12},
number = {3},
pages = {187--198},
year = {1998},
url = {https://doi.org/10.1023/A:1008220515881},
doi = {10.1023/A:1008220515881},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/YeandelTJ98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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