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@inproceedings{DBLP:conf/wcre/0006HZT20,
  author       = {Stefan Fischer and
                  Evelyn Nicole Haslinger and
                  Markus Zimmermann and
                  Hannes Thaller},
  title        = {An Empirical Evaluation for Object Initialization of Member Variables
                  in Unit Testing},
  booktitle    = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  pages        = {8--11},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VST50071.2020.9051634},
  doi          = {10.1109/VST50071.2020.9051634},
  timestamp    = {Thu, 16 Apr 2020 16:00:28 +0200},
  biburl       = {https://dblp.org/rec/conf/wcre/0006HZT20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/wcre/Buchgeher0MP20,
  author       = {Georg Buchgeher and
                  Stefan Fischer and
                  Michael Moser and
                  Josef Pichler},
  title        = {An Early Investigation of Unit Testing Practices of Component-Based
                  Software Systems},
  booktitle    = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  pages        = {12--15},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VST50071.2020.9051632},
  doi          = {10.1109/VST50071.2020.9051632},
  timestamp    = {Thu, 16 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/wcre/Buchgeher0MP20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/wcre/LuVD20,
  author       = {Zhong Xi Lu and
                  Sten Vercammen and
                  Serge Demeyer},
  title        = {Semi-automatic Test Case Expansion for Mutation Testing},
  booktitle    = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VST50071.2020.9051637},
  doi          = {10.1109/VST50071.2020.9051637},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/wcre/LuVD20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/wcre/SzatmariVB20,
  author       = {Attila Szatm{\'{a}}ri and
                  B{\'{e}}la Vancsics and
                  {\'{A}}rp{\'{a}}d Besz{\'{e}}des},
  title        = {Do Bug-Fix Types Affect Spectrum-Based Fault Localization Algorithms'
                  Efficiency?},
  booktitle    = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  pages        = {16--23},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VST50071.2020.9051638},
  doi          = {10.1109/VST50071.2020.9051638},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/wcre/SzatmariVB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/wcre/ThallerLE020,
  author       = {Hannes Thaller and
                  Lukas Linsbauer and
                  Alexander Egyed and
                  Stefan Fischer},
  title        = {Towards Fault Localization via Probabilistic Software Modeling},
  booktitle    = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  pages        = {24--27},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VST50071.2020.9051635},
  doi          = {10.1109/VST50071.2020.9051635},
  timestamp    = {Thu, 16 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/wcre/ThallerLE020.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/wcre/VancsicsGB20,
  author       = {B{\'{e}}la Vancsics and
                  Tam{\'{a}}s Gergely and
                  {\'{A}}rp{\'{a}}d Besz{\'{e}}des},
  title        = {Simulating the Effect of Test Flakiness on Fault Localization Effectiveness},
  booktitle    = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  pages        = {28--35},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VST50071.2020.9051636},
  doi          = {10.1109/VST50071.2020.9051636},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/wcre/VancsicsGB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/wcre/2020vst,
  title        = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/9040308/proceeding},
  isbn         = {978-1-7281-6271-3},
  timestamp    = {Thu, 16 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/wcre/2020vst.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}