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@inproceedings{DBLP:conf/vts/AbrahamGMRRGR14,
author = {Jacob A. Abraham and
Xinli Gu and
Teresa MacLaurin and
Janusz Rajski and
Paul G. Ryan and
Dimitris Gizopoulos and
Matteo Sonza Reorda},
title = {Special session 8B - Panel: In-field testing of SoC devices: Which
solutions by which players?},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--2},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818780},
doi = {10.1109/VTS.2014.6818780},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AbrahamGMRRGR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AgrawalC14,
author = {Mukesh Agrawal and
Krishnendu Chakrabarty},
title = {Test-time optimization in NOC-based manycore SOCs using multicast
routing},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818797},
doi = {10.1109/VTS.2014.6818797},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AgrawalC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AmouriHT14,
author = {Abdulazim Amouri and
Jochen Hepp and
Mehdi Baradaran Tahoori},
title = {Self-heating thermal-aware testing of FPGAs},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818753},
doi = {10.1109/VTS.2014.6818753},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AmouriHT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BasakZB14,
author = {Abhishek Basak and
Yu Zheng and
Swarup Bhunia},
title = {Active defense against counterfeiting attacks through robust antifuse-based
on-chip locks},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818793},
doi = {10.1109/VTS.2014.6818793},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/BasakZB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BiswasCDB14,
author = {Sounil Biswas and
John M. Carulli and
Dragoljub Gagi Drmanac and
Arpan Bhattacherjee},
title = {Innovative practices session 5C: Machine learning and data analysis
in test},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818766},
doi = {10.1109/VTS.2014.6818766},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BiswasCDB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CaiGL14,
author = {Xiaolei Cai and
Emil Gizdarski and
Dan Landau},
title = {A shared memory based parallel diagnosis system},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818789},
doi = {10.1109/VTS.2014.6818789},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CaiGL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Carulli14,
author = {John M. Carulli},
title = {Special session 11B: {ITRS} adaptive test update},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818799},
doi = {10.1109/VTS.2014.6818799},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Carulli14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChaCLM14,
author = {Soonyoung Cha and
Chang{-}Chih Chen and
Taizhi Liu and
Linda S. Milor},
title = {Extraction of threshold voltage degradation modeling due to Negative
Bias Temperature Instability in circuits with {I/O} measurements},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818769},
doi = {10.1109/VTS.2014.6818769},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChaCLM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChangOBKAD14,
author = {Doohwang Chang and
Sule Ozev and
Bertan Bakkaloglu and
Sayfe Kiaei and
Engin Afacan and
G{\"{u}}nhan D{\"{u}}ndar},
title = {Reliability enhancement using in-field monitoring and recovery for
{RF} circuits},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818774},
doi = {10.1109/VTS.2014.6818774},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChangOBKAD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenWT14,
author = {Jifeng Chen and
LeRoy Winemberg and
Mohammad Tehranipoor},
title = {Identification of testable representative paths for low-cost verification
of circuit performance during manufacturing and in-field tests},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818782},
doi = {10.1109/VTS.2014.6818782},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChenWT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ClarkC14,
author = {C. J. Clark and
V{\'{\i}}ctor H. Champac},
title = {Hot topic session 12B: Stay relevant with standards-based {DFT}},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818802},
doi = {10.1109/VTS.2014.6818802},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ClarkC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CollinsKC14,
author = {Dean Collins and
Ramesh Karri},
title = {Hot topic session 12A: Split manufacturing - IARPA's {TIC} program},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--2},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818801},
doi = {10.1109/VTS.2014.6818801},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CollinsKC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DalirsaniIW14,
author = {Atefe Dalirsani and
Michael E. Imhof and
Hans{-}Joachim Wunderlich},
title = {Structural Software-Based Self-Test of Network-on-Chip},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818754},
doi = {10.1109/VTS.2014.6818754},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DalirsaniIW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DeyatiMBC14,
author = {Sabyasachi Deyati and
Barry John Muldrey and
Aritra Banerjee and
Abhijit Chatterjee},
title = {Atomic model learning: {A} machine learning paradigm for post silicon
debug of RF/analog circuits},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818791},
doi = {10.1109/VTS.2014.6818791},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DeyatiMBC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DixitTZMC14,
author = {Charutosh Dixit and
Ramesh C. Tekumalla and
Wei Zhao and
Nilanjan Mukherjee and
Vivek Chickermane},
title = {Innovative practices session 1C: Existing/emerging low power techniques},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818744},
doi = {10.1109/VTS.2014.6818744},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DixitTZMC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Dworak14,
author = {Jennifer Dworak},
title = {Special session 4A: Elevator talks},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818757},
doi = {10.1109/VTS.2014.6818757},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Dworak14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/EckerS14,
author = {Allan Ecker and
Mani Soma},
title = {A method for phase noise extraction from data communication},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818742},
doi = {10.1109/VTS.2014.6818742},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/EckerS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FanVTPJK14,
author = {Yongquan Fan and
Anant Verma and
David S. Trager and
Ramin K. Poorfard and
John Janney and
Sandeep Kumar},
title = {Accelerating capture of infrequent errors on {ATE} for silicon {TV}
tuners},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818752},
doi = {10.1109/VTS.2014.6818752},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FanVTPJK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Gattiker14,
author = {Anne Gattiker},
title = {Unstructured text: Test analysis techniques applied to non-test problems},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--4},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818773},
doi = {10.1109/VTS.2014.6818773},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Gattiker14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HanS14,
author = {Chao Han and
Adit D. Singh},
title = {Improving {CMOS} open defect coverage using hazard activated tests},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818740},
doi = {10.1109/VTS.2014.6818740},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HanS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HarutyunyanTVZ14,
author = {Gurgen Harutyunyan and
Grigor Tshagharyan and
Valery A. Vardanian and
Yervant Zorian},
title = {Fault modeling and test algorithm creation strategy for FinFET-based
memories},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818747},
doi = {10.1109/VTS.2014.6818747},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HarutyunyanTVZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HsiaoCCGGC14,
author = {Sen{-}Wen Hsiao and
Chung{-}Chun Chen and
Randy Caplan and
Jeff Galloway and
Blake Gray and
Abhijit Chatterjee},
title = {Phase-locked loop design with {SPO} detection and charge pump trimming
for reference spur suppression},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818785},
doi = {10.1109/VTS.2014.6818785},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HsiaoCCGGC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HuHC14,
author = {Kai Hu and
Tsung{-}Yi Ho and
Krishnendu Chakrabarty},
title = {Test generation and design-for-testability for flow-based mVLSI microfluidic
biochips},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818760},
doi = {10.1109/VTS.2014.6818760},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HuHC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/IshidaYSFL14,
author = {Masahiro Ishida and
Takahiro J. Yamaguchi and
Mani Soma and
Terri S. Fiez and
Mike Peng Li},
title = {Special session 8C: Hot topic: Designers' and test researchers' roles
in analog design-for-test},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818781},
doi = {10.1109/VTS.2014.6818781},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/IshidaYSFL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JeongOTC14,
author = {Jae Woong Jeong and
Sule Ozev and
Friedrich Taenzler and
Hui{-}Chuan Chao},
title = {Development and empirical verification of an accuracy model for the
power down leakage tests},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818786},
doi = {10.1109/VTS.2014.6818786},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/JeongOTC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KaliorakisPFG14,
author = {Manolis Kaliorakis and
Mihalis Psarakis and
Nikos Foutris and
Dimitris Gizopoulos},
title = {Accelerated online error detection in many-core microprocessor architectures},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818755},
doi = {10.1109/VTS.2014.6818755},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KaliorakisPFG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KaminskaCB14,
author = {Bozena Kaminska and
Bernard Courtois and
Chris Bailey},
title = {New topic session 2B: Co-design and reliability of power electronic
modules - Current status and future challenges},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818748},
doi = {10.1109/VTS.2014.6818748},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KaminskaCB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KaminskaCKM14,
author = {Bozena Kaminska and
Bernard Courtois and
Mary Ann Maher},
title = {New topic session 7B: Challenges and opportunities in test and design
for test {(DFT)} of {MEMS} sensors},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818777},
doi = {10.1109/VTS.2014.6818777},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KaminskaCKM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KannanKKS14,
author = {Sachhidh Kannan and
Naghmeh Karimi and
Ramesh Karri and
Ozgur Sinanoglu},
title = {Detection, diagnosis, and repair of faults in memristor-based memories},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818762},
doi = {10.1109/VTS.2014.6818762},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KannanKKS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KapurP14,
author = {Rohit Kapur and
Irith Pomeranz},
title = {Innovative practices session 10C: Advances in {DFT} and compression},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818795},
doi = {10.1109/VTS.2014.6818795},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KapurP14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KimM14,
author = {Woongrae Kim and
Linda Milor},
title = {Built-in self test methodology for diagnosis of backend wearout mechanisms
in {SRAM} cells},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818746},
doi = {10.1109/VTS.2014.6818746},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KimM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KimMMM14,
author = {John Kim and
Wolfgang Meyer and
T. M. Mak and
Amitava Majumdar},
title = {Innovative practices session 3C: Solving today's test challenges},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818756},
doi = {10.1109/VTS.2014.6818756},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/KimMMM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LinBSB14,
author = {Yen{-}Tzu Lin and
Brady Benware and
Brian Stine and
Azeez Bhavnagarwala},
title = {Innovative practices session 2C: Advanced in yield learning},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818749},
doi = {10.1109/VTS.2014.6818749},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LinBSB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuFOB14,
author = {Tao Liu and
Chao Fu and
Sule Ozev and
Bertan Bakkaloglu},
title = {A built-in self-test technique for load inductance and lossless current
sensing of {DC-DC} converters},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818750},
doi = {10.1109/VTS.2014.6818750},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/LiuFOB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuLGC14,
author = {Zhiqiang Liu and
You Li and
Randall L. Geiger and
Degang Chen},
title = {Auto-identification of positive feedback loops in multi-state vulnerable
circuits},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--5},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818794},
doi = {10.1109/VTS.2014.6818794},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuLGC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MajumdarNMSGH14,
author = {Amitava Majumdar and
Suriya Natarajan and
Stephen K. Sunter and
Prashant Goteti and
Ke Huang},
title = {Innovative practices session 4C: Disruptive solutions in the non-digital
world},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818759},
doi = {10.1109/VTS.2014.6818759},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MajumdarNMSGH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MetwallyLXS14,
author = {Mohamed Metwally and
Nicholai L'Esperance and
Tian Xia and
Mustapha Slamani},
title = {Continuous wave radar circuitry testing using {OFDM} technique},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818775},
doi = {10.1109/VTS.2014.6818775},
timestamp = {Sun, 26 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MetwallyLXS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MetzlerTBDGV14,
author = {Carolina Metzler and
Aida Todri{-}Sanial and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Arnaud Virazel},
title = {{TSV} aware timing analysis and diagnosis in paths with multiple TSVs},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818772},
doi = {10.1109/VTS.2014.6818772},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MetzlerTBDGV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MirkhaniA14,
author = {Shahrzad Mirkhani and
Jacob A. Abraham},
title = {Fast evaluation of test vector sets using a simulation-based statistical
metric},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818739},
doi = {10.1109/VTS.2014.6818739},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MirkhaniA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MoonCKC14,
author = {Thomas Moon and
Hyun Woo Choi and
David C. Keezer and
Abhijit Chatterjee},
title = {Multi-channel testing architecture for high-speed eye-diagram using
pin electronics and subsampling monobit reconstruction algorithms},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818768},
doi = {10.1109/VTS.2014.6818768},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MoonCKC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NataleFRZ14,
author = {Giorgio Di Natale and
Marie{-}Lise Flottes and
Bruno Rouzeyre and
Hakim Zimouche},
title = {Built-in self-test for manufacturing {TSV} defects before bonding},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818771},
doi = {10.1109/VTS.2014.6818771},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NataleFRZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NatarajanMR14,
author = {Suriya Natarajan and
Amitava Majumdar and
Jeyavijayan Rajendran},
title = {Hot topic session 9C: Test and fault tolerance for emerging memory
technologies},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818788},
doi = {10.1109/VTS.2014.6818788},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/NatarajanMR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/OzevBO14,
author = {Sule Ozev and
Bertan Bakkaloglu},
title = {Special session 4B: Panel: Testing and calibration for power management
circuits},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818758},
doi = {10.1109/VTS.2014.6818758},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/OzevBO14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Pomeranz14,
author = {Irith Pomeranz},
title = {Fault simulation with test switching for static test compaction},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818738},
doi = {10.1109/VTS.2014.6818738},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Pomeranz14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Pomeranz14a,
author = {Irith Pomeranz},
title = {On the use of multi-cycle tests for storage of two-cycle broadside
tests},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818796},
doi = {10.1109/VTS.2014.6818796},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Pomeranz14a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PortolanM14,
author = {Michele Portolan and
Michail Maniatakos},
title = {Special session 8A: {E.J.} McCluskey Doctoral Thesis Award semi-final},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818779},
doi = {10.1109/VTS.2014.6818779},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PortolanM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RanoneTRGRZ14,
author = {Pasquale Ranone and
Giovanna Turvani and
Fabrizio Riente and
Mariagrazia Graziano and
Massimo Ruo Roch and
Maurizio Zamboni},
title = {Fault tolerant nanoarray circuits: Automatic design and verification},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818761},
doi = {10.1109/VTS.2014.6818761},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RanoneTRGRZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SanyalLS14,
author = {Alodeep Sanyal and
Yanjing Li},
title = {Special session 11C: Young professionals in test - Elevator talks},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818800},
doi = {10.1109/VTS.2014.6818800},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SanyalLS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SanyalLZ14,
author = {Alodeep Sanyal and
Yanjing Li and
Yervant Zorian},
title = {Special session 12C: Young professionals in test - Town meeting},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818803},
doi = {10.1109/VTS.2014.6818803},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SanyalLZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SenGuptaL14,
author = {Breeta SenGupta and
Erik Larsson},
title = {Test planning and test access mechanism design for stacked chips using
{ILP}},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818764},
doi = {10.1109/VTS.2014.6818764},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SenGuptaL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Singh14,
author = {Eshan Singh},
title = {Modeling location based wafer die yield variation in estimating 3D
stacked {IC} yield from wafer to wafer stacking},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818765},
doi = {10.1109/VTS.2014.6818765},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Singh14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/StellariSA14,
author = {Franco Stellari and
Peilin Song and
Herschel A. Ainspan},
title = {Functional block extraction for hardware security detection using
time-integrated and time-resolved emission measurements},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818792},
doi = {10.1109/VTS.2014.6818792},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/StellariSA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/StratigopoulosS14,
author = {Haralampos{-}G. D. Stratigopoulos and
Stephen Sunter},
title = {Efficient Monte Carlo-based analog parametric fault modelling},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818741},
doi = {10.1109/VTS.2014.6818741},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/StratigopoulosS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SunterCBR14,
author = {Stephen K. Sunter and
Steve Comen and
Paul Berndt and
Ram Rajamani},
title = {Innovative practices session 7C: Reduced pin-count testing - How low
can we go?},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818778},
doi = {10.1109/VTS.2014.6818778},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SunterCBR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TaouilHM14,
author = {Mottaqiallah Taouil and
Said Hamdioui and
Erik Jan Marinissen},
title = {Quality versus cost analysis for 3D Stacked ICs},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818763},
doi = {10.1109/VTS.2014.6818763},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TaouilHM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Viveros-WacherAADMMV14,
author = {Andres Viveros{-}Wacher and
Ricardo Alejos and
Liliana Alvarez and
Israel Diaz{-}Castro and
Brenda Marcial and
Gaston Motola{-}Acuna and
Edgar{-}Andrei Vega{-}Ochoa},
title = {{SMV} methodology enhancements for high speed {I/O} links of SoCs},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--5},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818767},
doi = {10.1109/VTS.2014.6818767},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Viveros-WacherAADMMV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WangCB14,
author = {Ran Wang and
Krishnendu Chakrabarty and
Sudipta Bhawmik},
title = {At-speed interconnect testing and test-path optimization for 2.5D
ICs},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818770},
doi = {10.1109/VTS.2014.6818770},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WangCB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WangKSC14,
author = {Xian Wang and
Blanchard Kenfack and
Estella Silva and
Abhijit Chatterjee},
title = {Alternative "safe" test of hysteretic power converters},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818751},
doi = {10.1109/VTS.2014.6818751},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WangKSC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WangWML14,
author = {Lu Wang and
Xutao Wang and
Milad Maleki and
Bao Liu},
title = {Power/ground supply voltage variation-aware delay test pattern generation},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818783},
doi = {10.1109/VTS.2014.6818783},
timestamp = {Thu, 21 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WangWML14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WuHKL14,
author = {Ya{-}Ru Wu and
Yi{-}Keng Hsieh and
Po{-}Chih Ku and
Liang{-}Hung Lu},
title = {A built-in gain calibration technique for {RF} low-noise amplifiers},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818776},
doi = {10.1109/VTS.2014.6818776},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WuHKL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WuLL14,
author = {Cheng{-}Hung Wu and
Kuen{-}Jong Lee and
Wei{-}Cheng Lien},
title = {An efficient diagnosis method to deal with multiple fault-pairs simultaneously
using a single circuit model},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818790},
doi = {10.1109/VTS.2014.6818790},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WuLL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/XuC14,
author = {Li Xu and
Degang Chen},
title = {Accurate and efficient method of jitter and noise separation and its
application to {ADC} testing},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--5},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818743},
doi = {10.1109/VTS.2014.6818743},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/XuC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YangLHLLCH14,
author = {Hao{-}Yu Yang and
Chen{-}Wei Lin and
Chao{-}Ying Huang and
Ching{-}Ho Lu and
Chen{-}An Lai and
Mango Chia{-}Tso Chao and
Rei{-}Fu Huang},
title = {Testing methods for a write-assist disturbance-free dual-port {SRAM}},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818745},
doi = {10.1109/VTS.2014.6818745},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/YangLHLLCH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YangLKDLHPW14,
author = {Ping{-}Lin Yang and
Cheng{-}Chung Lin and
Ming{-}Zhang Kuo and
Sang{-}Hoo Dhong and
Chien{-}Min Lin and
Kevin Huang and
Ching{-}Nen Peng and
Min{-}Jer Wang},
title = {A 4-GHz universal high-frequency on-chip testing platform for {IP}
validation},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818787},
doi = {10.1109/VTS.2014.6818787},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/YangLKDLHPW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YeFYCT14,
author = {Fangming Ye and
Farshad Firouzi and
Yang Yang and
Krishnendu Chakrabarty and
Mehdi Baradaran Tahoori},
title = {On-chip voltage-droop prediction using support-vector machines},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818798},
doi = {10.1109/VTS.2014.6818798},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/YeFYCT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhangW14,
author = {Tengteng Zhang and
Duncan M. Hank Walker},
title = {Improved power supply noise control for pseudo functional test},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818784},
doi = {10.1109/VTS.2014.6818784},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZhangW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2014,
title = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://ieeexplore.ieee.org/xpl/conhome/6811042/proceeding},
isbn = {978-1-4799-2611-4},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/2014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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