Search dblp for Publications

export results for "toc:db/conf/mtdt/mtdt2001.bht:"

 download as .bib file

@inproceedings{DBLP:conf/mtdt/Al-ArsAG01,
  author       = {Zaid Al{-}Ars and
                  Ad J. van de Goor},
  title        = {Transient Faults in DRAMs: Concepts, Analysis and Impact on Tests},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {59--64},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945229},
  doi          = {10.1109/MTDT.2001.945229},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Al-ArsAG01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/GregoriTKM01,
  author       = {Stefano Gregori and
                  Guido Torelli and
                  Osama Khouri and
                  Rino Micheloni},
  title        = {An Error Control Code Scheme for Multilevel Flash Memories},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {45--50},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945227},
  doi          = {10.1109/MTDT.2001.945227},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/GregoriTKM01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/HamdiouiGER01,
  author       = {Said Hamdioui and
                  Ad J. van de Goor and
                  David Eastwick and
                  Mike Rodgers},
  title        = {Realistic Fault Models and Test Procedures for Multi-Port SRAMs},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {65--72},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945230},
  doi          = {10.1109/MTDT.2001.945230},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/HamdiouiGER01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/Harling01,
  author       = {G. Harling},
  title        = {A {DRAM} Compiler for Fully Optimized Memory Instances},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {3--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945221},
  doi          = {10.1109/MTDT.2001.945221},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Harling01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/KarimiLIC01,
  author       = {Farzin Karimi and
                  Fabrizio Lombardi and
                  V. Swamy Irrinki and
                  T. Crosby},
  title        = {A Parallel Approach for Testing Multi-Port Static Random Access Memories},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {73},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945233},
  doi          = {10.1109/MTDT.2001.945233},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KarimiLIC01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/KesslerDMMK01,
  author       = {Brian R. Kessler and
                  Jeffrey H. Dreibelbis and
                  Tim McMahon and
                  Joshua S. McCloy and
                  Rex Kho},
  title        = {BIST-Based Bitfail Mapping of an Embedded {DRAM}},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {29},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945225},
  doi          = {10.1109/MTDT.2001.945225},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KesslerDMMK01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/KhouriGSTM01,
  author       = {Osama Khouri and
                  Stefano Gregori and
                  Dario Soltesz and
                  Guido Torelli and
                  Rino Micheloni},
  title        = {Low Output Resistance Charge Pump for Flash Memory Programming},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {99},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945236},
  doi          = {10.1109/MTDT.2001.945236},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KhouriGSTM01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/KimRL01,
  author       = {Kyung{-}Saeng Kim and
                  KwangMyoung Rho and
                  Kwyro Lee},
  title        = {Orthogonal Transpose-RAM Cell Array Architecture with Alternate Bit-Line
                  To Bit-Line Contact Scheme},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {9--12},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945222},
  doi          = {10.1109/MTDT.2001.945222},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KimRL01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/KoranneWBWKV01,
  author       = {Sandeep Koranne and
                  Tom Waayers and
                  Robert Beurze and
                  Clemens Wouters and
                  Sunil Kumar and
                  G. S. Visweswara},
  title        = {A {P1500} Compliant Programable BistShell for Embedded Memories},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {21--28},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945224},
  doi          = {10.1109/MTDT.2001.945224},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KoranneWBWKV01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/MatarreseF01,
  author       = {Stella Matarrese and
                  Luca Fasoli},
  title        = {A Method to Caculate Redundancy Coverage for {FLASH} Memory},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {41--44},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945226},
  doi          = {10.1109/MTDT.2001.945226},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/MatarreseF01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/NapperY01,
  author       = {Simon Napper and
                  Dian Yang},
  title        = {Equivalence Checking a 256MB {SDRAM}},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {85--90},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945234},
  doi          = {10.1109/MTDT.2001.945234},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/NapperY01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/ShoukourianVZ01,
  author       = {Samvel K. Shoukourian and
                  Valery A. Vardanian and
                  Yervant Zorian},
  title        = {An Approach for Evaluation of Redunancy Analysis Algorithms},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {51},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945228},
  doi          = {10.1109/MTDT.2001.945228},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/ShoukourianVZ01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/SunXT01,
  author       = {Xiaoling Sun and
                  Jian Xu and
                  Pieter M. Trouborst},
  title        = {Testing Carry Logic Modules of SRAM-based FPGAs},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {91--98},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945235},
  doi          = {10.1109/MTDT.2001.945235},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/SunXT01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/SungKBEC01,
  author       = {Raymond J. Sung and
                  John C. Koob and
                  Tyler L. Brandon and
                  Duncan G. Elliott and
                  Bruce F. Cockburn},
  title        = {Design of an Embedded Fully-Depleted {SOI} {SRAM}},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {13},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945223},
  doi          = {10.1109/MTDT.2001.945223},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/SungKBEC01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/mtdt/2001,
  title        = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/7514/proceeding},
  isbn         = {0-7695-1242-9},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/mtdt/2001.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.