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@inproceedings{DBLP:conf/itc-asia/ChaoH23,
author = {Wei{-}Ji Chao and
Tong{-}Yu Hsieh},
title = {Cost-Effective Error-Mitigation for High Memory Error Rate of {DNN:}
{A} Case Study on YOLOv4},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301172},
doi = {10.1109/ITC-ASIA58802.2023.10301172},
timestamp = {Wed, 15 Nov 2023 09:43:46 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/ChaoH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/ChengLCH23,
author = {Hao Cheng and
Chi{-}Jhe Li and
Hung{-}Lin Chen and
Jiun{-}Lang Huang},
title = {BDD-Based Self-Test Program Generation for Processor Cores},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301167},
doi = {10.1109/ITC-ASIA58802.2023.10301167},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/ChengLCH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/ChuangLM23,
author = {Po{-}Yao Chuang and
Francesco Lorenzelli and
Erik Jan Marinissen},
title = {Generating Test Patterns for Chiplet Interconnects: Achieving Optimal
Effectiveness and Efficiency},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301169},
doi = {10.1109/ITC-ASIA58802.2023.10301169},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/ChuangLM23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/HarrisonY23,
author = {Lee Harrison and
Wu Yang},
title = {Scalable hierarchical {DFT} technologies for AI, {SOC} and multi-die
: Tutorial 1},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301179},
doi = {10.1109/ITC-ASIA58802.2023.10301179},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/HarrisonY23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/HongCC23,
author = {Hao{-}Chiao Hong and
Chien{-}Hung Chen and
Yu{-}Wun Chen},
title = {Parametric Faults in Computing-in-Memory Applications of a 4kb Read-Decoupled
8T {SRAM} Array in 40nm {CMOS}},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301157},
doi = {10.1109/ITC-ASIA58802.2023.10301157},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/HongCC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/HongZZLCH23,
author = {Liang Hong and
Ge Zhu and
Jing Zhou and
Xuefei Li and
Ziyi Chen and
Wei Hu},
title = {Hunting for Hardware Trojan in Gate Netlist: {A} Stacking Ensemble
Learning Perspective},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301162},
doi = {10.1109/ITC-ASIA58802.2023.10301162},
timestamp = {Wed, 29 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/HongZZLCH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/KatohYZZKKNHKSIOI23,
author = {Kentaroh Katoh and
Shuhei Yamamoto and
Zheming Zhao and
Yujie Zhao and
Shogo Katayama and
Anna Kuwana and
Takayuki Nakatani and
Kazumi Hatayama and
Haruo Kobayashi and
Keno Sato and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa},
title = {A Physically Unclonable Function Using Time-to-Digital Converter with
Linearity Self-Calibration and its {FPGA} Implementation},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301181},
doi = {10.1109/ITC-ASIA58802.2023.10301181},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/KatohYZZKKNHKSIOI23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/KeezerML23,
author = {David C. Keezer and
Dany Minier and
Hongjie Li},
title = {Experimental Evaluation of Jitter Reduction Methods for Multi-Gigahertz
Test},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301184},
doi = {10.1109/ITC-ASIA58802.2023.10301184},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/KeezerML23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/LeeCH23,
author = {Yi{-}Hsuan Lee and
Wei{-}Hao Chen and
Shi{-}Yu Huang},
title = {Self-Sufficient Clock Jitter Measurement Methodology Using Dithering-Based
Calibration},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301177},
doi = {10.1109/ITC-ASIA58802.2023.10301177},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/LeeCH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/LiZ23,
author = {Xuejian Li and
Zhengguang Zhu},
title = {Software Defect Detection Based on Feature Fusion and Alias Analysis},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301168},
doi = {10.1109/ITC-ASIA58802.2023.10301168},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/LiZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/LuD23,
author = {Shyue{-}Kung Lu and
Xin Dong},
title = {Integrated Progressive Built-In Self-Repair {(IPBISR)} Techniques
for {NAND} Flash Memory},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301164},
doi = {10.1109/ITC-ASIA58802.2023.10301164},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/LuD23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/Marinissen23,
author = {Erik Jan Marinissen},
title = {Moore Meets Murphy : Invited Talk 1},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301183},
doi = {10.1109/ITC-ASIA58802.2023.10301183},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/Marinissen23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/Olson23,
author = {Janet Olson},
title = {Test industry challenges and solutions as observed by the leading
physical implementation solution provider : Invited Talk 2},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301163},
doi = {10.1109/ITC-ASIA58802.2023.10301163},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/Olson23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/Orii23,
author = {Yasumitsu Orii},
title = {Semiconductor Packaging Revolution in the Era of Chiplets : Keynote
1},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301180},
doi = {10.1109/ITC-ASIA58802.2023.10301180},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/Orii23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/SamalKM23,
author = {Anwesh Kumar Samal and
Sandeep Kumar and
Atin Mukherjee},
title = {Design of Single Node Upset Resilient Latch for Low Power, Low Cost
and Highly Robust Applications},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301176},
doi = {10.1109/ITC-ASIA58802.2023.10301176},
timestamp = {Mon, 27 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/SamalKM23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/TakayaS23,
author = {Ayano Takaya and
Michihiro Shintani},
title = {Feasibility Study of Incremental Neural Network Based Test Escape
Detection by Introducing Transfer Learning Technique},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301182},
doi = {10.1109/ITC-ASIA58802.2023.10301182},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/TakayaS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/TokaiAYH23,
author = {Shogo Tokai and
Daichi Akamatsu and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
title = {On Test Pattern Generation Method for an Approximate Multiplier Considering
Acceptable Faults},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301158},
doi = {10.1109/ITC-ASIA58802.2023.10301158},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/TokaiAYH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/TsaiH23,
author = {Chen{-}Lin Tsai and
Shi{-}Yu Huang},
title = {Trustworthy Lifetime Prediction by Aging History Analysis and Multi-Level
Stress Test},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301189},
doi = {10.1109/ITC-ASIA58802.2023.10301189},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/TsaiH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/WuCLCH23,
author = {Meng{-}Shan Wu and
Yen{-}Lin Chua and
Jin{-}Fu Li and
Yun{-}Ting Chuan and
Shih{-}Hsu Huang},
title = {Fault-Aware {ECC} Scheme for Enhancing the Read Reliability of STT-MRAMs},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301173},
doi = {10.1109/ITC-ASIA58802.2023.10301173},
timestamp = {Thu, 16 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/WuCLCH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/Yamamichi23,
author = {Shintaro Yamamichi},
title = {Technology for The Future of Computing : Keynote 2},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301171},
doi = {10.1109/ITC-ASIA58802.2023.10301171},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/Yamamichi23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/YamanakaANF23,
author = {Yuki Yamanaka and
Masayuki Arai and
Yoshikazu Nagamura and
Satoshi Fukumoto},
title = {Toward Improvement and Evaluation of Reconstruction Capability of
CapsNet-Based Wafer Map Defect Pattern Classifier},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301159},
doi = {10.1109/ITC-ASIA58802.2023.10301159},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/YamanakaANF23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/YanXHNCGW23,
author = {Aibin Yan and
Jing Xiang and
Zhengfeng Huang and
Tianming Ni and
Jie Cui and
Patrick Girard and
Xiaoqing Wen},
title = {Design of {A} Highly Reliable and Low-Power {SRAM} With Double-Node
Upset Recovery for Safety-critical Applications},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301170},
doi = {10.1109/ITC-ASIA58802.2023.10301170},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/YanXHNCGW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/YanXNCHGW23,
author = {Aibin Yan and
Fan Xia and
Tianming Ni and
Jie Cui and
Zhengfeng Huang and
Patrick Girard and
Xiaoqing Wen},
title = {A Low Overhead and Double-Node-Upset Self-Recoverable Latch},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301166},
doi = {10.1109/ITC-ASIA58802.2023.10301166},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/YanXNCHGW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/YanZWCHGW23,
author = {Aibin Yan and
Chao Zhou and
Shaojie Wei and
Jie Cui and
Zhengfeng Huang and
Patrick Girard and
Xiaoqing Wen},
title = {Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh
Radiation Hardness},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301187},
doi = {10.1109/ITC-ASIA58802.2023.10301187},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/YanZWCHGW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/ZainolKB23,
author = {Mohd Amiruddin Zainol and
Sompon Khamron and
Ng Gua Bin},
title = {Optimizing Post-Silicon Validation for {FPGA} Serial Configuration
using an Automation Framework and Timing Characterization Verification},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301165},
doi = {10.1109/ITC-ASIA58802.2023.10301165},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/ZainolKB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/ZhangCHLH23,
author = {Bin Zhang and
Ye Cai and
Zhiheng He and
Sen Liang and
Wei He},
title = {Structured {DFT} Development Approach for Chisel-Based High Performance
{RISC-V} Processors},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301174},
doi = {10.1109/ITC-ASIA58802.2023.10301174},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/ZhangCHLH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/Zorian23,
author = {Yervant Zorian},
title = {Silicon Lifecycle Management: Trends, Challenges and Solutions : Tutorial
2},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301186},
doi = {10.1109/ITC-ASIA58802.2023.10301186},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/Zorian23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc-asia/2023,
title = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023},
doi = {10.1109/ITC-ASIA58802.2023},
isbn = {979-8-3503-1281-2},
timestamp = {Wed, 15 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/2023.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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