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@inproceedings{DBLP:conf/dft/AhlawatTGFS19, author = {Satyadev Ahlawat and Jaynarayan T. Tudu and Manoj Singh Gaur and Masahiro Fujita and Virendra Singh}, title = {Preventing Scan Attack through Test Response Encryption}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875355}, doi = {10.1109/DFT.2019.8875355}, timestamp = {Thu, 23 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/AhlawatTGFS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/BosioORKVNANFH19, author = {Alberto Bosio and Ian O'Connor and Gennaro Severino Rodrigues and Fernanda Lima Kastensmidt and Elena I. Vatajelu and Giorgio Di Natale and Lorena Anghel and Surya Nagarajan and Moritz Fieback and Said Hamdioui}, title = {Rebooting Computing: The Challenges for Test and Reliability}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {8138--8143}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875270}, doi = {10.1109/DFT.2019.8875270}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/BosioORKVNANFH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/ChapmanTMHYKK19, author = {Glenn H. Chapman and Rohan Thomas and Klinsmann J. Coelho Silva Meneses and Bifei Huang and Hao Yang and Israel Koren and Zahava Koren}, title = {Detecting SEUs in Noisy Digital Imagers with small pixels}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875486}, doi = {10.1109/DFT.2019.8875486}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/ChapmanTMHYKK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/ChoudhuryS19, author = {Avishek Choudhury and Biplab K. Sikdar}, title = {{CORE-VR:} {A} Coherence and Reusability Aware Low Voltage Fault Tolerant Cache in Multicore}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875457}, doi = {10.1109/DFT.2019.8875457}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/ChoudhuryS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/DuASBS19, author = {Boyang Du and Sarah Azimi and Corrado De Sio and Ludovica Bozzoli and Luca Sterpone}, title = {On the Reliability of Convolutional Neural Network Implementation on SRAM-based {FPGA}}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875362}, doi = {10.1109/DFT.2019.8875362}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/DuASBS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/FoutrisKL19, author = {Nikos Foutris and Christos Kotselidis and Mikel Luj{\'{a}}n}, title = {Simulating Wear-out Effects of Asymmetric Multicores at the Architecture Level}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875468}, doi = {10.1109/DFT.2019.8875468}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/FoutrisKL19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/FuchsCWMFHTLPM19, author = {Christian M. Fuchs and Pai H. Chou and Xiaoqing Wen and Nadia M. Murillo and Gianluca Furano and Stefan Holst and Antonis Tavoularis and Shyue{-}Kung Lu and Aske Plaat and Kostas Marinis}, title = {A Fault-Tolerant MPSoC For CubeSats}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875417}, doi = {10.1109/DFT.2019.8875417}, timestamp = {Fri, 09 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/FuchsCWMFHTLPM19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/GambardellaKBDK19, author = {Giulio Gambardella and Johannes Kappauf and Michaela Blott and Christoph Doehring and Martin Kumm and Peter Zipf and Kees A. Vissers}, title = {Efficient Error-Tolerant Quantized Neural Network Accelerators}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875314}, doi = {10.1109/DFT.2019.8875314}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/GambardellaKBDK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/GaoZYYR19, author = {Zhen Gao and Jinhua Zhu and Lina Yan and Tong Yan and Pedro Reviriego}, title = {Reliability Evaluation of Polyphase-filter based Decimators Implemented on SRAM-FPGAs}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875316}, doi = {10.1109/DFT.2019.8875316}, timestamp = {Mon, 21 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/GaoZYYR19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/GnoliCPUKMIVGMO19, author = {Luca Gnoli and Giuseppe Carnicelli and Alessio Parisi and Luca Urbinati and Burim Kabashi and Fabio Michieletti and Sebastian Ignacio Peradotto Ibarra and Marco Vacca and Mariagrazia Graziano and Jimson Mathew and Marco Ottavi}, title = {Fault Tolerant Photovoltaic Array: {A} Repair Circuit Based on Memristor Sensing}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875467}, doi = {10.1109/DFT.2019.8875467}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/GnoliCPUKMIVGMO19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/HosokawaYMYHA19, author = {Toshinori Hosokawa and Hiroshi Yamazaki and Kenichiro Misawa and Masayoshi Yoshimura and Yuki Hirama and Masavuki Arai}, title = {A Low Capture Power Oriented X-filling Method Using Partial MaxSAT Iteratively}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875434}, doi = {10.1109/DFT.2019.8875434}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/HosokawaYMYHA19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/IchiharaMII19, author = {Hideyuki Ichihara and Yuki Maeda and Tsuyoshi Iwagaki and Tomoo Inoue}, title = {State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875383}, doi = {10.1109/DFT.2019.8875383}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/IchiharaMII19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/JenihhinRBA19, author = {Maksim Jenihhin and Matteo Sonza Reorda and Aneesh Balakrishnan and Dan Alexandrescu}, title = {Challenges of Reliability Assessment and Enhancement in Autonomous Systems}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875379}, doi = {10.1109/DFT.2019.8875379}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/JenihhinRBA19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/KlineLMJ19, author = {Donald Kline Jr. and Stephen Longofono and Rami G. Melhem and Alex K. Jones}, title = {Predicting Single Event Effects in {DRAM}}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875328}, doi = {10.1109/DFT.2019.8875328}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/KlineLMJ19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/LasherasCRC19, author = {Ana Lasheras and Ramon Canal and Eva Rodr{\'{\i}}guez and Luca Cassano}, title = {Protecting {RSA} Hardware Accelerators against Differential Fault Analysis through Residue Checking}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875320}, doi = {10.1109/DFT.2019.8875320}, timestamp = {Thu, 23 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/LasherasCRC19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/LiRXK19, author = {Jiaqiang Li and Pedro Reviriego and Liyi Xiao and Alexander Klockmann}, title = {Protecting Large Word Size Memories against MCUs with 3-bit Burst Error Correction}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875396}, doi = {10.1109/DFT.2019.8875396}, timestamp = {Tue, 29 Dec 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/LiRXK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/LiuRNPXL19, author = {Shanshan Liu and Pedro Reviriego and Kazuteru Namba and Salvatore Pontarelli and Liyi Xiao and Fabrizio Lombardi}, title = {Low Redundancy Double Error Correction Spotty Codes Combined with Gray Coding for 64 Data Bits Memories of 4-bit Multilevel Cells}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875283}, doi = {10.1109/DFT.2019.8875283}, timestamp = {Wed, 10 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/LiuRNPXL19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/LuzaBGJMD19, author = {Lucas Matana Luza and Alexandre Besser and Viyas Gupta and Arto Javanainen and Ali Mohammadzadeh and Luigi Dilillo}, title = {Effects of Heavy Ion and Proton Irradiation on a {SLC} {NAND} Flash Memory}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875475}, doi = {10.1109/DFT.2019.8875475}, timestamp = {Tue, 16 Aug 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/LuzaBGJMD19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/MascioMGFM19, author = {Stefano Di Mascio and Alessandra Menicucci and Eberhard K. A. Gill and Gianluca Furano and Claudio Monteleone}, title = {On the Criticality of Caches in Fault-Tolerant Processors for Space}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875424}, doi = {10.1109/DFT.2019.8875424}, timestamp = {Fri, 01 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/MascioMGFM19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/MerchantDBAYJ19, author = {Feroze Merchant and Anandraj Devarajan and Anik Basu and David Ashen and Brandon Yelton and Prashant D. Joshi}, title = {High Performance Memory Repair}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875490}, doi = {10.1109/DFT.2019.8875490}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/MerchantDBAYJ19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/MousaviPC019, author = {Mahsa Mousavi and Hamid Reza Pourshaghaghi and Henk Corporaal and Akash Kumar}, title = {Scatter Scrubbing: {A} Method to Reduce {SEU} Repair Time in {FPGA} Configuration Memory}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875431}, doi = {10.1109/DFT.2019.8875431}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/MousaviPC019.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/OliveiraNR19, author = {Daniel Oliveira and Philippe O. A. Navaux and Paolo Rech}, title = {Increasing the Efficiency and Efficacy of Selective-Hardening for Parallel Applications}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875300}, doi = {10.1109/DFT.2019.8875300}, timestamp = {Wed, 01 Dec 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/OliveiraNR19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/PathroseLK19, author = {Jerrin Pathrose and Leon van de Logt and Hans G. Kerkhoff}, title = {Analog Test Interface for {IEEE} 1687 Employing Split {SAR} Architecture to Support Embedded Instrument Dependability Applications}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875372}, doi = {10.1109/DFT.2019.8875372}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/PathroseLK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/PrevilonKKR19, author = {Fritz G. Previlon and Charu Kalra and David R. Kaeli and Paolo Rech}, title = {A Comprehensive Evaluation of the Effects of Input Data on the Resilience of {GPU} Applications}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875269}, doi = {10.1109/DFT.2019.8875269}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/PrevilonKKR19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/RuospoC0SGB19, author = {Annachiara Ruospo and Riccardo Cantoro and Ernesto S{\'{a}}nchez and Pasquale Davide Schiavone and Angelo Garofalo and Luca Benini}, title = {On-line Testing for Autonomous Systems driven by {RISC-V} Processor Design Verification}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875345}, doi = {10.1109/DFT.2019.8875345}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/RuospoC0SGB19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/SanchezBSS19, author = {Antonio J. S{\'{a}}nchez and Yubal Barrios and Lucana Santos and Roberto Sarmiento}, title = {Evaluation of {TMR} effectiveness for soft error mitigation in SHyLoC compression {IP} core implemented on Zynq SoC under heavy ion radiation}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875281}, doi = {10.1109/DFT.2019.8875281}, timestamp = {Mon, 09 Jan 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/SanchezBSS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/SantosoJ19, author = {Danny Santoso and Hyeran Jeon}, title = {Understanding of {GPU} Architectural Vulnerability for Deep Learning Workloads}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875404}, doi = {10.1109/DFT.2019.8875404}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/SantosoJ19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/SimevskiSCK19, author = {Aleksandar Simevski and Patryk Skoncej and Cristiano Calligaro and Milos Krstic}, title = {Scalable and Configurable Multi-Chip {SRAM} in a Package for Space Applications}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875489}, doi = {10.1109/DFT.2019.8875489}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/SimevskiSCK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/TsaiLHS19, author = {Tsai{-}Ling Tsai and Jin{-}Fu Li and Chun{-}Lung Hsu and Chi{-}Tien Sun}, title = {Testing of In-Memory-Computing 8T SRAMs}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875487}, doi = {10.1109/DFT.2019.8875487}, timestamp = {Tue, 17 Oct 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/TsaiLHS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/UlbrichtSK19, author = {Markus Ulbricht and Rizwan Tariq Syed and Milos Krstic}, title = {Developing a Configurable Fault Tolerant Multicore System for Optimized Sensor Processing}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875433}, doi = {10.1109/DFT.2019.8875433}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/UlbrichtSK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/ValleroC19, author = {Alessandro Vallero and Stefano Di Carlo}, title = {Combining Cluster Sampling and {ACE} analysis to improve fault-injection based reliability evaluation of GPU-based systems}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {8138--8143}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875392}, doi = {10.1109/DFT.2019.8875392}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/ValleroC19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/YoshimuraTYH19, author = {Masayoshi Yoshimura and Yuki Takeuchi and Hiroshi Yamazaki and Toshinori Hosokawa}, title = {A State Assignment Method to Improve Transition Fault Coverage for Controllers}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875322}, doi = {10.1109/DFT.2019.8875322}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/YoshimuraTYH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/ZehMR19, author = {Alexander Zeh and Manuela Meier and Viola Rieger}, title = {Parity-Based Concurrent Error Detection Schemes for the ChaCha Stream Cipher}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875478}, doi = {10.1109/DFT.2019.8875478}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/ZehMR19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/dft/2019, title = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, publisher = {{IEEE}}, year = {2019}, url = {https://ieeexplore.ieee.org/xpl/conhome/8863044/proceeding}, isbn = {978-1-7281-2260-1}, timestamp = {Tue, 22 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dft/2019.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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