"Effects of Depth Variation of Substrate Dopant Impurity Concentration on ..."

Cheng-Sheng Pan (1986)

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type: Book or Thesis

metadata version: 2023-09-14

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Cheng-Sheng Pan:
Effects of Depth Variation of Substrate Dopant Impurity Concentration on the Interface Trap Density Determination in Mos Devices (Semiconductor). University of Illinois Urbana-Champaign, USA, 1986

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