"Physical and Electrical Properties of Hot -Carrier Degradation of Silicon ..."

Zhi Chen (1999)

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type: Book or Thesis

metadata version: 2023-08-03

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Zhi Chen:
Physical and Electrical Properties of Hot -Carrier Degradation of Silicon *Mos Transistors Processed in Deuterium and Hydrogen. University of Illinois Urbana-Champaign, USA, 1999

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