"Reliability and 1/f noise properties of MOSFETs with nitrided oxide gate ..."

Rajsekhar Jayaraman (1988)

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type: Book or Thesis

metadata version: 2022-05-04

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Rajsekhar Jayaraman:
Reliability and 1/f noise properties of MOSFETs with nitrided oxide gate dielectrics. Massachusetts Institute of Technology, Cambridge, MA, USA, 1988

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