"Design tool and methodologies for interconnect reliability analysis in ..."

Syed M. Alam (2004)

> Home

Details and statistics

DOI: —

access: closed

type: Book or Thesis

metadata version: 2022-05-04

- view
  - electronic edition via handle.net
- export record
  dblp key:
  - phd/ndltd/Alam04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/phd/ndltd/Alam04
Syed M. Alam:
Design tool and methodologies for interconnect reliability analysis in integrated circuits. Massachusetts Institute of Technology, Cambridge, MA, USA, 2004

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.