"Impact of Bias Temperature Instability and Random Telegraph Noise on CMOS ..."

Takashi Matsumoto (2015)

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DOI: 10.14989/DOCTOR.K19137

access: closed

type: Book or Thesis

metadata version: 2023-10-24

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Takashi Matsumoto:
Impact of Bias Temperature Instability and Random Telegraph Noise on CMOS Logic Circuits. Kyoto University, Japan, 2015

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