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"Le test haute résolution de circuits imprimés nus. (The test ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Christophe Vaucher (1993)

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DOI: —

access: open

type: Book or Thesis

metadata version: 2020-07-21

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  - electronic edition @ archives-ouvertes.fr (open access)
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  dblp key:
  - phd/hal/Vaucher93
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  persistent URL:
  - https://dblp.org/rec/phd/hal/Vaucher93
Christophe Vaucher:
Le test haute résolution de circuits imprimés nus. (The test of high resolution bare printed circuit boards). Grenoble Institute of Technology, France, 1993

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