Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Reliability-centric probabilistic analysis of VLSI circuits."

Thara Rejimon (2006)

> Home

Details and statistics

DOI: —

access: closed

type: Book or Thesis

metadata version: 2022-12-30

- view
  - electronic edition @ usf.edu
  - electronic edition @ usf.edu
  authority control:
- export record
  dblp key:
  - phd/basesearch/Rejimon06a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/phd/basesearch/Rejimon06a
Thara Rejimon:
Reliability-centric probabilistic analysis of VLSI circuits. University of South Florida, Tampa, USA, 2006

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.