"Statistical Enhancement of Terminal Current Estimation for Monte Carlo ..."

P. Douglas Yoder et al. (1998)

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DOI: 10.1155/1998/34726

access: open

type: Journal Article

metadata version: 2023-05-08

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P. Douglas Yoder, Ulrich Krumbein, Klaus Gärtner, Nobuo Sasaki, Wolfgang Fichtner:
Statistical Enhancement of Terminal Current Estimation for Monte Carlo Device Simulation. VLSI Design 6(1-4): 303-306 (1998)

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