"A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated ..."

Ioannis Voyiatzis (2008)

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DOI: 10.1155/2008/680157

access: open

type: Journal Article

metadata version: 2018-11-24

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Ioannis Voyiatzis:
A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences. VLSI Design 2008: 680157:1-680157:8 (2008)

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