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"Effect of Reverse Body Bias on Current Testing of 0.18 μm Gates."

Xiaomei Liu, Prachi Sathe, Samiha Mourad (2001)

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DOI: 10.1155/2001/79703

access: open

type: Journal Article

metadata version: 2023-05-08

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  - journals/vlsi/LiuSM01
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  - https://dblp.org/rec/journals/vlsi/LiuSM01
Xiaomei Liu, Prachi Sathe, Samiha Mourad:
Effect of Reverse Body Bias on Current Testing of 0.18 μm Gates. VLSI Design 12(4): 501-513 (2001)

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