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"An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in ..."

Hyung Ki Lee, Dong S. Ha (1994)

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DOI: 10.1155/1994/71941

access: open

type: Journal Article

metadata version: 2022-11-09

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Hyung Ki Lee, Dong S. Ha:
An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits. VLSI Design 2(3): 199-207 (1994)

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