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"MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing."

David C. Keezer et al. (2008)

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DOI: 10.1155/2008/291686

access: open

type: Journal Article

metadata version: 2018-11-24

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  - https://dblp.org/rec/journals/vlsi/KeezerMDVFM08
David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop:
MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing. VLSI Design 2008: 291686:1-291686:8 (2008)

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