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"The Impact of Statistical Leakage Models on Design Yield Estimation."

Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif (2011)

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DOI: 10.1155/2011/471903

access: open

type: Journal Article

metadata version: 2018-11-24

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  - https://dblp.org/rec/journals/vlsi/KanjJN11
Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif:
The Impact of Statistical Leakage Models on Design Yield Estimation. VLSI Design 2011: 471903:1-471903:12 (2011)

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