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"Characterization of Single-Electron Tunneling Transistors for Designing ..."

Changyun Zhu et al. (2009)

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DOI: 10.1109/TVLSI.2008.2009013

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/ZhuGDSK09
Changyun Zhu, Zhengyu Gu, Robert P. Dick, Li Shang, Robert G. Knobel:
Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems. IEEE Trans. Very Large Scale Integr. Syst. 17(5): 646-659 (2009)

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