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"Path Delay Test Generation Toward Activation of Worst Case Coupling Effects."

Minjin Zhang, Huawei Li, Xiaowei Li (2011)

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DOI: 10.1109/TVLSI.2010.2075945

access: closed

type: Journal Article

metadata version: 2023-05-11

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Minjin Zhang, Huawei Li, Xiaowei Li:
Path Delay Test Generation Toward Activation of Worst Case Coupling Effects. IEEE Trans. Very Large Scale Integr. Syst. 19(11): 1969-1982 (2011)

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