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"A Single Ring-Oscillator-Based Test Structure for Timing Characterization ..."

Haoming Zhang, Shuowei Li, Tetsuya Iizuka (2024)

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DOI: 10.1109/TVLSI.2024.3370862

access: closed

type: Journal Article

metadata version: 2024-05-17

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Haoming Zhang, Shuowei Li, Tetsuya Iizuka:
A Single Ring-Oscillator-Based Test Structure for Timing Characterization of Dynamic Circuit. IEEE Trans. Very Large Scale Integr. Syst. 32(5): 938-951 (2024)

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