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"Efficient test-point selection for scan-based BIST."
Huan-Chih Tsai et al. (1998)
- Huan-Chih Tsai, Kwang-Ting Cheng
, Chih-Jen Lin
, Sudipta Bhawmik:
Efficient test-point selection for scan-based BIST. IEEE Trans. Very Large Scale Integr. Syst. 6(4): 667-676 (1998)
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