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"Intrinsic MOSFET parameter fluctuations due to random dopant placement."

Xinghai Tang, Vivek De, James D. Meindl (1997)

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DOI: 10.1109/92.645063

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/TangDM97
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  - https://dblp.org/rec/journals/tvlsi/TangDM97
Xinghai Tang, Vivek De, James D. Meindl:
Intrinsic MOSFET parameter fluctuations due to random dopant placement. IEEE Trans. Very Large Scale Integr. Syst. 5(4): 369-376 (1997)

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