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"Statistical analysis of subthreshold leakage current for VLSI circuits."

Rajeev R. Rao et al. (2004)

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DOI: 10.1109/TVLSI.2003.821549

access: closed

type: Journal Article

metadata version: 2022-06-10

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Rajeev R. Rao, Ashish Srivastava, David T. Blaauw, Dennis Sylvester:
Statistical analysis of subthreshold leakage current for VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 12(2): 131-139 (2004)

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