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"Broadside and Functional Broadside Tests for Partial-Scan Circuits."

Irith Pomeranz, Sudhakar M. Reddy (2011)

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DOI: 10.1109/TVLSI.2010.2044049

access: closed

type: Journal Article

metadata version: 2020-03-11

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Irith Pomeranz, Sudhakar M. Reddy:
Broadside and Functional Broadside Tests for Partial-Scan Circuits. IEEE Trans. Very Large Scale Integr. Syst. 19(6): 1104-1108 (2011)

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