"Effectiveness of Low-Voltage Testing to Detect Interconnect Open Defects ..."

Jesús Moreno, Michel Renovell, Víctor H. Champac (2016)

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DOI: 10.1109/TVLSI.2015.2397934

access: closed

type: Journal Article

metadata version: 2022-03-10

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Jesús Moreno, Michel Renovell, Víctor H. Champac:
Effectiveness of Low-Voltage Testing to Detect Interconnect Open Defects Under Process Variations. IEEE Trans. Very Large Scale Integr. Syst. 24(1): 378-382 (2016)

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