default search action
"Utilizing Circuit Structure for Scan Chain Diagnosis."
Wei-Hen Lo et al. (2014)
- Wei-Hen Lo, Ang-Chih Hsieh, Chien-Ming Lan, Min-Hsien Lin, TingTing Hwang:
Utilizing Circuit Structure for Scan Chain Diagnosis. IEEE Trans. Very Large Scale Integr. Syst. 22(12): 2766-2778 (2014)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.