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"On Reducing Test Power and Test Volume by Selective Pattern Compression ..."

Chia-Yi Lin, Hsiu-Chuan Lin, Hung-Ming Chen (2010)

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DOI: 10.1109/TVLSI.2009.2021061

access: closed

type: Journal Article

metadata version: 2020-03-11

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Chia-Yi Lin, Hsiu-Chuan Lin, Hung-Ming Chen:
On Reducing Test Power and Test Volume by Selective Pattern Compression Schemes. IEEE Trans. Very Large Scale Integr. Syst. 18(8): 1220-1224 (2010)

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