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"Improving Multi-Level NAND Flash Memory Storage Reliability Using ..."

Shu Li, Tong Zhang (2010)

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DOI: 10.1109/TVLSI.2009.2024154

access: closed

type: Journal Article

metadata version: 2020-03-11

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Shu Li, Tong Zhang:
Improving Multi-Level NAND Flash Memory Storage Reliability Using Concatenated BCH-TCM Coding. IEEE Trans. Very Large Scale Integr. Syst. 18(10): 1412-1420 (2010)

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