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"A statistical study of defect maps of large area VLSI IC's."

Israel Koren, Zahava Koren, Charles H. Stapper (1994)

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DOI: 10.1109/92.285750

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/KorenKS94
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  - https://dblp.org/rec/journals/tvlsi/KorenKS94
Israel Koren, Zahava Koren, Charles H. Stapper:
A statistical study of defect maps of large area VLSI IC's. IEEE Trans. Very Large Scale Integr. Syst. 2(2): 249-256 (1994)

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