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"Statistical Leakage Estimation of Double Gate FinFET Devices Considering ..."

Jie Gu et al. (2008)

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DOI: 10.1109/TVLSI.2007.909809

access: closed

type: Journal Article

metadata version: 2021-03-02

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Jie Gu, John Keane, Sachin S. Sapatnekar, Chris H. Kim:
Statistical Leakage Estimation of Double Gate FinFET Devices Considering the Width Quantization Property. IEEE Trans. Very Large Scale Integr. Syst. 16(2): 206-209 (2008)

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