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"Transistor Variability Modeling and its Validation With Ring-Oscillation ..."

Hiroshi Fuketa et al. (2010)

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DOI: 10.1109/TVLSI.2009.2020594

access: closed

type: Journal Article

metadata version: 2022-01-03

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Hiroshi Fuketa, Masanori Hashimoto, Yukio Mitsuyama, Takao Onoye:
Transistor Variability Modeling and its Validation With Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits. IEEE Trans. Very Large Scale Integr. Syst. 18(7): 1118-1129 (2010)

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