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"Design-for-testability for embedded delay-locked loops."

Tom Egan, Samiha Mourad (2005)

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DOI: 10.1109/TVLSI.2005.853622

access: closed

type: Journal Article

metadata version: 2021-03-10

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Tom Egan, Samiha Mourad:
Design-for-testability for embedded delay-locked loops. IEEE Trans. Very Large Scale Integr. Syst. 13(8): 984-988 (2005)

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