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"Analyzing the Inherent Reliability of Moderately Sized Magnetic and ..."

Timothy J. Dysart, Peter M. Kogge (2009)

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DOI: 10.1109/TVLSI.2008.2008092

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/DysartK09
Timothy J. Dysart, Peter M. Kogge:
Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices. IEEE Trans. Very Large Scale Integr. Syst. 17(4): 507-516 (2009)

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