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"A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip ..."

Khanh N. Dang et al. (2017)

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DOI: 10.1109/TVLSI.2017.2736004

access: closed

type: Journal Article

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/DangATOA17
Khanh N. Dang, Akram Ben Ahmed, Xuan-Tu Tran, Yuichi Okuyama, Abderazek Ben Abdallah:
A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model. IEEE Trans. Very Large Scale Integr. Syst. 25(11): 3099-3112 (2017)

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