"Automatic linearity and frequency response tests with built-in pattern ..."

Foster F. Dai, Charles E. Stroud, Dayu Yang (2006)

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DOI: 10.1109/TVLSI.2006.878201

access: closed

type: Journal Article

metadata version: 2020-03-11

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Foster F. Dai, Charles E. Stroud, Dayu Yang:
Automatic linearity and frequency response tests with built-in pattern generator and analyzer. IEEE Trans. Very Large Scale Integr. Syst. 14(6): 561-572 (2006)

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