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"Automated synthesis of pseudo-exhaustive test generator in VLSI BIST design."

Chien-In Henry Chen, Joel T. Yuen (1994)

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DOI: 10.1109/92.311637

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/ChenY94
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Chien-In Henry Chen, Joel T. Yuen:
Automated synthesis of pseudo-exhaustive test generator in VLSI BIST design. IEEE Trans. Very Large Scale Integr. Syst. 2(3): 273-291 (1994)

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