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"Design-Time Reliability Enhancement Using Hotspot Identification for RF ..."

Doohwang Chang et al. (2016)

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DOI: 10.1109/TVLSI.2015.2428221

access: closed

type: Journal Article

metadata version: 2023-09-30

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Doohwang Chang, Jennifer N. Kitchen, Bertan Bakkaloglu, Sayfe Kiaei, Sule Ozev:
Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits. IEEE Trans. Very Large Scale Integr. Syst. 24(3): 1179-1183 (2016)

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