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"Reliability-Aware Test Methodology for Detecting Short-Channel Faults in ..."

Biswajit Bhowmik et al. (2018)

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DOI: 10.1109/TVLSI.2018.2803478

access: closed

type: Journal Article

metadata version: 2020-03-11

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Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya:
Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks. IEEE Trans. Very Large Scale Integr. Syst. 26(6): 1026-1039 (2018)

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