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"The edge process model and its application to information-hiding capacity ..."

Sviatoslav Voloshynovskiy et al. (2006)

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DOI: 10.1109/TSP.2006.871965

access: closed

type: Journal Article

metadata version: 2020-12-29

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  - https://dblp.org/rec/journals/tsp/VoloshynovskiyKMP06
Sviatoslav Voloshynovskiy, Oleksiy J. Koval, Mehmet Kivanç Mihçak, Thierry Pun:
The edge process model and its application to information-hiding capacity analysis. IEEE Trans. Signal Process. 54(5): 1813-1825 (2006)

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