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"Ordered Reliability Bits Guessing Random Additive Noise Decoding."

Ken R. Duffy, Wei An, Muriel Médard (2022)

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DOI: 10.1109/TSP.2022.3203251

access: open

type: Journal Article

metadata version: 2023-07-27

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  - journals/tsp/DuffyAM22
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  - https://dblp.org/rec/journals/tsp/DuffyAM22
Ken R. Duffy, Wei An, Muriel Médard:
Ordered Reliability Bits Guessing Random Additive Noise Decoding. IEEE Trans. Signal Process. 70: 4528-4542 (2022)

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