"Optimal Selection of Imperfect Tests for Fault Detection and Isolation."

Shigang Zhang et al. (2013)

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DOI: 10.1109/TSMC.2013.2244210

access: closed

type: Journal Article

metadata version: 2020-05-20

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Shigang Zhang, Krishna R. Pattipati, Zheng Hu, Xisen Wen:
Optimal Selection of Imperfect Tests for Fault Detection and Isolation. IEEE Trans. Syst. Man Cybern. Syst. 43(6): 1370-1384 (2013)

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