"A Bayesian framework for multilead SMD post-placement quality inspection."

Michael E. Zervakis, Stefanos Goumas, George A. Rovithakis (2004)

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DOI: 10.1109/TSMCB.2003.817037

access: closed

type: Journal Article

metadata version: 2020-05-30

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Michael E. Zervakis, Stefanos Goumas, George A. Rovithakis:
A Bayesian framework for multilead SMD post-placement quality inspection. IEEE Trans. Syst. Man Cybern. Part B 34(1): 440-453 (2004)

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