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"Predicting Time to Failure Using the IMM and Excitable Tests."

E. Phelps et al. (2007)

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DOI: 10.1109/TSMCA.2007.902621

access: closed

type: Journal Article

metadata version: 2020-05-25

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E. Phelps, Peter Willett, Thia Kirubarajan, Craig Brideau:
Predicting Time to Failure Using the IMM and Excitable Tests. IEEE Trans. Syst. Man Cybern. Part A 37(5): 630-642 (2007)

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