"Intelligent Inspection of Electronic Devices in Specific Environments via ..."

Bo Liu et al. (2025)

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DOI: 10.1109/TSMC.2025.3539699

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type: Journal Article

metadata version: 2025-05-09

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Bo Liu, Jing Guo, Yaowei Wang, Chengrong Yang, Fengtao Nan, Yun Yang:
Intelligent Inspection of Electronic Devices in Specific Environments via a Novel Cascade Network of Combining Mixed Sampling and Nonstrided Convolution. IEEE Trans. Syst. Man Cybern. Syst. 55(5): 3287-3299 (2025)

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